PIC18F65K90-I/MR Microchip Technology, PIC18F65K90-I/MR Datasheet - Page 416

32kB Flash, 2kB RAM, 1kB EE, NanoWatt XLP, LCD 64 QFN 9x9x0.9mm TUBE

PIC18F65K90-I/MR

Manufacturer Part Number
PIC18F65K90-I/MR
Description
32kB Flash, 2kB RAM, 1kB EE, NanoWatt XLP, LCD 64 QFN 9x9x0.9mm TUBE
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Datasheet

Specifications of PIC18F65K90-I/MR

Processor Series
PIC18F
Core
PIC
Data Bus Width
8 bit
Program Memory Type
Flash
Program Memory Size
32 KB
Data Ram Size
2 KB
Interface Type
I2C, SPI
Maximum Clock Frequency
64 MHz
Number Of Timers
8
Operating Supply Voltage
1.8 V to 5.5 V
Maximum Operating Temperature
+ 125 C
3rd Party Development Tools
52715-96, 52716-328, 52717-734, 52712-325, EWPIC18
Minimum Operating Temperature
- 40 C
On-chip Adc
12 bit, 16 Channel
Core Processor
PIC
Core Size
8-Bit
Speed
64MHz
Connectivity
I²C, LIN, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, LCD, POR, PWM, WDT
Number Of I /o
53
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 16x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-VFQFN Exposed Pad
Lead Free Status / Rohs Status
 Details
PIC18F87K90 FAMILY
27.4.2
There is a small amount of capacitance from the
internal A/D Converter sample capacitor, as well as
stray capacitance from the circuit board traces and
pads that affect the precision of capacitance measure-
ments. A measurement of the stray capacitance can be
taken by making sure the desired capacitance to be
measured has been removed.
After removing the capacitance to be measured:
1.
2.
3.
4.
5.
6.
Where:
• I is known from the current source measurement
• t is a fixed delay
• V is measured by performing an A/D conversion
DS39957D-page 416
step
Initialize the A/D Converter and the CTMU.
Set EDG1STAT (= 1 ).
Wait for a fixed delay of time, t .
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the stray and A/D sample capacitances:
C
OFFSET
CAPACITANCE CALIBRATION
= C
STRAY
+ C
AD
= (I • t)/V
This measured value is then stored and used for
calculations of time measurement or subtracted for
capacitance measurement. For calibration, it is
expected that the capacitance of C
approximately known; C
An iterative process may be required to adjust the time,
t , that the circuit is charged to obtain a reasonable volt-
age reading from the A/D Converter. The value of t may
be determined by setting C
and solving for t . For example, if C
calculated to be 11 pF, and V is expected to be 70% of
V
or 63  s.
See
capacitance calibration.
DD
or 2.31V, t would be:
Example 27-3
(4 pF + 11 pF) • 2.31V/0.55 A
 2009-2011 Microchip Technology Inc.
for a typical routine for CTMU
AD
OFFSET
is approximately 4 pF.
to a theoretical value
STRAY
STRAY
is theoretically
+ C
AD
is

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