EP3SL150F1152C2N Altera, EP3SL150F1152C2N Datasheet - Page 403
EP3SL150F1152C2N
Manufacturer Part Number
EP3SL150F1152C2N
Description
IC STRATX III FPGA 150K 1152FBGA
Manufacturer
Altera
Series
Stratix® IIIr
Datasheets
1.EP3SL150F780C4N.pdf
(16 pages)
2.EP3SL150F780C4N.pdf
(332 pages)
3.EP3SL150F780C4N.pdf
(456 pages)
Specifications of EP3SL150F1152C2N
Number Of Logic Elements/cells
142500
Number Of Labs/clbs
5700
Total Ram Bits
6390
Number Of I /o
744
Voltage - Supply
0.86 V ~ 1.15 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1152-FBGA
For Use With
544-2568 - KIT DEVELOPMENT STRATIX III
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Other names
544-2409
EP3SL150F1152C2NES
EP3SL150F1152C2NES
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
EP3SL150F1152C2N
Manufacturer:
ALTERA
Quantity:
20 000
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Chapter 13: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Stratix III Devices
IEEE Std. 1149.1 Boundary-Scan Register
Boundary-Scan Cells of a Stratix III Device I/O Pin
Figure 13–4. Stratix III Device's User I/O BSC with IEEE Std. 1149.1 BST Circuitry
© July 2010
To or From
Circuitry
I/O Cell
and/or
Device
Logic
Array
Altera Corporation
OUTJ
OEJ
The Stratix III device three-bit boundary-scan cell (BSC) consists of a set of capture
registers and a set of update registers. The capture registers can connect to internal
device data through the OUTJ, OEJ, and PIN_IN signals, while the update registers
connect to external data through the PIN_OUT and PIN_OE signals.
The global control signals for the IEEE Std. 1149.1 BST registers (such as shift,
clock, and update) are generated internally by the TAP controller. The MODE signal
is generated by a decode of the instruction register. The HIGHZ signal is high when
executing the HIGHZ instruction. The data signal path for the boundary-scan register
runs from the serial data in (SDI) signal to the serial data out (SDO) signal. The scan
register begins at the TDI pin and ends at the TDO pin of the device.
Figure 13–4
INJ
SDI
shows the Stratix III device's user I/O boundary-scan cell.
0
1
0
1
0
1
SHIFT
D
D
D
OUTPUT
CLOCK
Registers
Capture
INPUT
OE
Q
Q
Q
SDO
D
D
UPDATE
Registers
D
OUTPUT
INPUT
Update
OE
Q
Q
Q
HIGHZ
V
CC
0
1
MODE
0
1
0
1
0
1
Signals
Global
Stratix III Device Handbook, Volume 1
PIN_OUT
PIN_OE
PIN_IN
Output
Buffer
Pin
13–5
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