mc68hc912dg128 Freescale Semiconductor, Inc, mc68hc912dg128 Datasheet - Page 111

• Manufacturer Part Number: mc68hc912dg128
• Description: M68hc12 Microcontrollers
• Manufacturer: Freescale Semiconductor, Inc

FEETST — Flash EEPROM Module Test Register
MC68HC912DG128 — Rev 3.0
MOTOROLA
RESET:
FSTE
Bit 7
0
GADR
6
0
In normal mode, writes to FEETST control bits have no effect and always
read zero. The Flash EEPROM module cannot be placed in test mode
inadvertently during normal operation.
FSTE — Stress Test Enable
GADR — Gate/Drain Stress Test Select
HVT — Stress Test High Voltage Status
FENLV — Enable Low Voltage
FDISVFP — Disable Status V
When the V
module will not allow writing to the LAT bit; the user cannot erase or
program the Flash module. The FDISVFP control bit enables writing
to the LAT bit regardless of the voltage on the V
Freescale Semiconductor, Inc.
For More Information On This Product,
0 = Disables the gate/drain stress circuitry
1 = Enables the gate/drain stress circuitry
0 = Selects the drain stress circuitry
1 = Selects the gate stress circuitry
0 = High voltage not present during stress test
1 = High voltage present during stress test
0 = Disables low voltage transistor in current reference circuit
1 = Enables low voltage transistor in current reference circuit
0 = Enable the automatic lock mechanism if V
1 = Disable the automatic lock mechanism if V
HVT
5
0
Go to: www.freescale.com
FP
FENLV
pin is below normal programming voltage the Flash
Flash Memory
4
0
FDISVFP
3
0
FP
Voltage Lock
VTCK
2
0
STRE
1
0
Flash EEPROM Registers
FP
FP
FP
pin.
is low
MWPR
is low
Bit 0
0
Technical Data
Flash Memory
$00F6
111