DEMO9RS08KA2 Freescale Semiconductor, DEMO9RS08KA2 Datasheet - Page 111

DEMO BOARD FOR 9RS08KA2

DEMO9RS08KA2

Manufacturer Part Number
DEMO9RS08KA2
Description
DEMO BOARD FOR 9RS08KA2
Manufacturer
Freescale Semiconductor
Series
RS08r
Type
MCUr

Specifications of DEMO9RS08KA2

Contents
Board, Cable, CD, Documentation, Sample ICs
Processor To Be Evaluated
RS08KA2
Data Bus Width
8 bit
Interface Type
USB
Silicon Manufacturer
Freescale
Core Architecture
RS08
Core Sub-architecture
RS08
Silicon Core Number
MC9RS08
Silicon Family Name
RS08KA
Rohs Compliant
Yes
For Use With/related Products
MC9RS08KA2
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
DEMO9RS08KA2
Manufacturer:
Freescale Semiconductor
Quantity:
135
Solving
where K is a constant pertaining to the particular part. K can be determined from
measuring P
obtained by solving equations 1 and 2 iteratively for any value of T
A.4
Although damage from static discharge is much less common on these devices than on early CMOS
circuits, normal handling precautions should be used to avoid exposure to static discharge. Qualification
tests are performed to ensure that these devices can withstand exposure to reasonable levels of static
without suffering any permanent damage. All ESD testing is in conformity with CDF-AEC-Q00 Stress
Test Qualification for Automotive Grade Integrated Circuits. (http://www.aecouncil.com/) A device is
considered to have failed if, after exposure to ESD pulses, the device no longer meets the device
specification requirements. Complete dc parametric and functional testing is performed per the applicable
device specification at room temperature followed by hot temperature, unless specified otherwise in the
device specification.
A.5
This section includes information about power supply requirements, I/O pin characteristics, and power
supply current in various operating modes.
Freescale Semiconductor
ESD Target for Machine Model (MM)
ESD Target for Human Body Model (HBM)
Supply voltage (run, wait and stop modes.)
Minimum RAM retention supply voltage applied to V
Low-voltage Detection threshold
Power on RESET (POR) voltage
Input high voltage (V
Input high voltage (1.8 V ≤ V
MM circuit description
HBM circuit description
0 < f
Bus
Equation A-1
Electrostatic Discharge (ESD) Protection Characteristics
DC Characteristics
<10MHz
D
(at equilibrium) for a known T
DD
Parameter
> 2.3V) (all digital inputs)
Parameter
and
DD
Equation A-2
≤ 2.3 V) (all digital inputs)
(Temperature Range = –40 to 85°C Ambient)
K = P
Table A-3. ESD Protection Characteristics
(V
(V
DD
DD
MC9RS08KA2 Series Data Sheet, Rev. 4
D
falling)
rising)
P
Table A-4. DC Characteristics
× (T
D
for K gives:
= K ÷ (T
A
DD
+ 273°C) + θ
A
. Using this value of K, the values of P
J
+ 273°C)
Symbol
V
V
V
V
V
V
RAM
POR
Symbol
LVD
V
DD
V
IH
IH
JA
THHBM
THMM
× (P
D
0.70 × V
0.85 × V
)
2
0.8
1.80
1.88
Min
1.8
0.9
A
.
1
DD
DD
Appendix A Electrical Characteristics
Typical
Value
2000
1.86
1.94
200
1.4
Equation A-3
D
and T
Max
1.95
2.03
5.5
1.7
J
can be
by
Eqn. A-2
Eqn. A-3
Unit
Unit
V
V
V
V
V
V
V
V
111

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