P60ARM-B Zarlink Semiconductor, Inc., P60ARM-B Datasheet - Page 95

• Manufacturer Part Number: P60ARM-B
• Description: 32-bit RISC microprocessor
• Manufacturer: Zarlink Semiconductor, Inc.

Boundary Scan Test Interface
The EXTEST instruction connects the BS register between TDI and TDO .
When the instruction register is loaded with the EXTEST instruction, all the boundary-scan cells are placed
in their test mode of operation.
In the CAPTURE-DR state, inputs from the system pins and outputs from the boundary-scan output cells
to the system pins are captured by the boundary-scan cells. In the SHIFT-DR state, the previously captured
test data is shifted out of the BS register via the TDO pin, whilst new test data is shifted in via the TDI pin
to the BS register parallel input latch. In the UPDATE-DR state, the new test data is transferred into the BS
register parallel output latch. Note that this data is applied immediately to the system logic and system
pins. The first EXTEST vector should be clocked into the boundary-scan register, using the SAMPLE/
PRELOAD instruction, prior to selecting INTEST to ensure that known data is applied to the system logic.
8.5.2 SAMPLE/PRELOAD (0011)
The BS (boundary-scan) register is placed in normal (system) mode by the SAMPLE/PRELOAD
instruction.
The SAMPLE/PRELOAD instruction connects the BS register between TDI and TDO .
When the instruction register is loaded with the SAMPLE/PRELOAD instruction, all the boundary-scan
cells are placed in their normal system mode of operation.
In the CAPTURE-DR state, a snapshot of the signals at the boundary-scan cells is taken on the rising edge
of TCK . Normal system operation is unaffected. In the SHIFT-DR state, the sampled test data is shifted out
of the BS register via the TDO pin, whilst new data is shifted in via the TDI pin to preload the BS register
parallel input latch. In the UPDATE-DR state, the preloaded data is transferred into the BS register parallel
output latch. Note that this data is not applied to the system logic or system pins while the SAMPLE/
PRELOAD instruction is active. This instruction should be used to preload the boundary-scan register with
known data prior to selecting the INTEST or EXTEST instructions (see the table below for appropriate
guard values to be used for each boundary-scan cell).
8.5.3 CLAMP (0101)
The CLAMP instruction connects a 1 bit shift register (the BYPASS register) between TDI and TDO .
When the CLAMP instruction is loaded into the instruction register, the state of all output signals is defined
by the values previously loaded into the boundary-scan register. A guarding pattern (specified for this
device at the end of this section) should be pre-loaded into the boundary-scan register using the SAMPLE/
PRELOAD instruction prior to selecting the CLAMP instruction.
In the CAPTURE-DR state, a logic 0 is captured by the bypass register. In the SHIFT-DR state, test data is
shifted into the bypass register via TDI and out via TDO after a delay of one TCK cycle. Note that the first
bit shifted out will be a zero. The bypass register is not affected in the UPDATE-DR state.
8.5.4 HIGHZ (0111)
The HIGHZ instruction connects a 1 bit shift register (the BYPASS register) between TDI and TDO .
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