AMD-K6 AMD [Advanced Micro Devices], AMD-K6 Datasheet - Page 132

• Manufacturer Part Number: AMD-K6
• Description: AMD-K6 Processor
• Manufacturer: AMD [Advanced Micro Devices]

AMD-K6
5.46
Summary
Sampled
5.47
Summary
Driven and Floated
5.48
Summary
Sampled
114
®
Processor Data Sheet
TMS (Test Mode Select)
TDI (Test Data Input)
TDO (Test Data Output)
Input, Internal Pullup
T D I i s t h e s e r i a l t e s t d a t a a n d i n s t r u c t i o n i n p u t fo r
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
The processor samples TDI on every rising TCK edge but only
while in the Shift-IR and Shift-DR states.
Output
TDO is the serial test data and instruction out put for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
The processor drives TDO on every falling TCK edge but only
while in the Shift-IR and Shift-DR states. TDO is floated at all
other times.
Input, Internal Pullup
TMS specifies the test function and sequence of state changes
for boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
The processor samples TMS on every rising TCK edge. If TMS is
sampled High for five or more consecutive clocks, the TAP
controller enters its Test-Logic-Reset state, regardless of the
controller state. This action is the same as that achieved by
asserting TRST#.
Preliminary Information
Signal Descriptions
20695H/0—March 1998
Chapter 5