MC56F8147VPYE Freescale Semiconductor, MC56F8147VPYE Datasheet - Page 153

IC DSP 16BIT 40MHZ 160-LQFP

MC56F8147VPYE

Manufacturer Part Number
MC56F8147VPYE
Description
IC DSP 16BIT 40MHZ 160-LQFP
Manufacturer
Freescale Semiconductor
Series
56F8xxxr
Datasheet

Specifications of MC56F8147VPYE

Core Processor
56800
Core Size
16-Bit
Speed
40MHz
Connectivity
EBI/EMI, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
76
Program Memory Size
128KB (64K x 16)
Program Memory Type
FLASH
Ram Size
4K x 16
Voltage - Supply (vcc/vdd)
2.25 V ~ 3.6 V
Data Converters
A/D 16x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 105°C
Package / Case
160-LQFP
Data Bus Width
16 bit
Processor Series
MC56F81xx
Core
56800E
Data Ram Size
4 KB
Interface Type
SPI, SCI, CAN
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
76
Number Of Timers
2
Maximum Operating Temperature
+ 105 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
4 x 12 bit, 4 Channel
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MC56F8147VPYE
Manufacturer:
FREESCAL
Quantity:
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Part Number:
MC56F8147VPYE
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Analog-to-Digital Converter (ADC) Parameters
Figure 10-22 ADC Absolute Error Over Processing and Temperature Extremes Before
and After Calibration for VDC
= 0.60V and 2.70V
in
Note: The absolute error data shown in the graphs above reflects the effects of both gain error and offset
error. The data was taken on 15 parts: five each from four processing corner lots as well as five from one
nominally processed lot, each at three temperatures: -40°C, 27°C, and 150°C (giving the 75 data points
shown above), for two input DC voltages: 0.60V and 2.70V. The data indicates that for the given
population of parts, calibration significantly reduced (by as much as 24%) the collective variation (spread)
of the absolute error of the population. It also significantly reduced (by as much as 38%) the mean
(average) of the absolute error and thereby brought it significantly closer to the ideal value of zero.
Although not guaranteed, it is believed that calibration will produce results similar to those shown above
for any population of parts including those which represent processing and temperature extremes.
56F8347 Technical Data, Rev.11
Freescale Semiconductor
153
Preliminary

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