EP4CE55F23C8N Altera, EP4CE55F23C8N Datasheet - Page 257

• Manufacturer Part Number: EP4CE55F23C8N
• Description: IC CYCLONE IV FPGA 55K 484FBGA
• Manufacturer: Altera
• Series: CYCLONE® IV Er

Specifications of EP4CE55F23C8N

• Number Of Logic Elements/cells: 55856
• Number Of Labs/clbs: 3491
• Total Ram Bits: 2340000
• Number Of I /o: 324
• Voltage - Supply: 1.15 V ~ 1.25 V
• Mounting Type: Surface Mount
• Operating Temperature: 0°C ~ 85°C
• Package / Case: 484-FBGA
• Family Name: Cyclone IV
• Number Of Logic Blocks/elements: 55856
• # I/os (max): 324
• Logic Cells: 55856
• Ram Bits: 2396160
• Operating Temp Range: 0C to 85C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 484
• Package Type: FBGA
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Number Of Gates: -
• Lead Free Status / Rohs Status: Compliant

© February 2010 Altera Corporation
CYIV-51010-1.1
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This chapter describes the boundary-scan test (BST) features that are supported in
Cyclone
this chapter.
Cyclone IV devices (Cyclone IV E devices and Cyclone IV GX devices) support IEEE
Std. 1149.1. Cyclone IV GX devices also support IEEE Std. 1149.6. The IEEE Std. 1149.6
(AC JTAG) is only supported on the high-speed serial interface (HSSI) transceivers in
Cyclone IV GX devices. The purpose of IEEE Std. 1149.6 is to enable board-level
connectivity checking between transmitters and receivers that are AC coupled.
This chapter includes the following sections:
■
■
■
■
For more information about the JTAG instructions code with descriptions and IEEE
Std.1149.1 BST guidelines, refer to the
Cyclone III Devices
For more information about the following topics, refer to
Boundary-Scan Testing in Altera
■
■
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“IEEE Std. 1149.6 Boundary-Scan Register” on page 10–2
“BST Operation Control” on page 10–3
“I/O Voltage Support in a JTAG Chain” on page 10–5
“Boundary-Scan Description Language Support” on page 10–6
IEEE Std. 1149.1 BST architecture and circuitry
TAP controller state-machine
Instruction mode

IV devices. The features are similar to Cyclone III devices, unless stated in
chapter.
10. JTAG Boundary-Scan Testing for
Devices:
IEEE 1149.1 (JTAG) Boundary-Scan Testing for
Cyclone IV Devices
AN 39: IEEE 1149.1 (JTAG)
Cyclone IV Device Handbook, Volume 1