S9S12HY64J0MLH Freescale Semiconductor, S9S12HY64J0MLH Datasheet - Page 739

• Manufacturer Part Number: S9S12HY64J0MLH
• Description: MCU 64K FLASH AUTO 64-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of S9S12HY64J0MLH

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 32MHz
• Connectivity: CAN, EBI/EMI, I²C, IrDA, LIN, SCI, SPI
• Peripherals: LCD, Motor control PWM, POR, PWM, WDT
• Number Of I /o: 50
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 4K x 8
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 6x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 64-LQFP
• Controller Family/series: S12
• No. Of I/o's: 50
• Ram Memory Size: 4KB
• Cpu Speed: 64MHz
• No. Of Timers: 2
• Rohs Compliant: Yes
• Processor Series: S12HY
• Core: HCS12
• 3rd Party Development Tools: EWHCS12
• Development Tools By Supplier: DEMO9S12HY64
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Freescale Semiconductor
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
3. Spec table quotes typical endurance evaluated at 25 C for this product family. For additional information on how Freescale
Conditions are shown in
Num C
application.
to 25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618
defines Typical Endurance, please refer to Engineering Bulletin EB619.
1
2
3
4
5
6
Javg
does not exceed 85 C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention at an average junction temperature of T
C Program Flash number of program/erase cycles
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data Flash number of program/erase cycles (-40 C tj 150 C
85 C
(-40 C
85 C
85 C
85 C
(1)
1
1
1
All values shown in
characterization.
after up to 50,000 program/erase cycles
after up to 10,000 program/erase cycles
after less than 100 program/erase cycles
after up to 10,000 program/erase cycles
tj
150 C
Table A-4
MC9S12HY/HA-Family Reference Manual, Rev. 1.04
unless otherwise noted
Table A-17. NVM Reliability Characteristics
Rating
Table A-17
Program Flash Arrays
Data Flash Array
are preliminary and subject to further
NOTE
Javg
Javg
Javg
Javg
=
=
=
=
Symbol
t
t
t
t
NVMRET
NVMRET
NVMRET
NVMRET
n
n
FLPE
FLPE
Min
10K
50K
20
10
20
5
100K
500K
100
100
100
100
Typ
Electrical Characteristics
(2)
2
2
2
(3)
3
Max
—
—
—
—
—
—
Cycles
Cycles
Years
Years
Years
Years
Unit
739