SAM9XE512 Atmel Corporation, SAM9XE512 Datasheet - Page 64

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SAM9XE512

Manufacturer Part Number
SAM9XE512
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM9XE512

Flash (kbytes)
512 Kbytes
Pin Count
217
Max. Operating Frequency
180 MHz
Cpu
ARM926
Hardware Qtouch Acquisition
No
Max I/o Pins
96
Ext Interrupts
96
Usb Transceiver
3
Usb Speed
Full Speed
Usb Interface
Host, Device
Spi
2
Twi (i2c)
2
Uart
6
Ssc
1
Ethernet
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
Yes
Adc Channels
4
Adc Resolution (bits)
10
Adc Speed (ksps)
312
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
32
Self Program Memory
NO
External Bus Interface
1
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.65 to 1.95
Fpu
No
Mpu / Mmu
No / Yes
Timers
6
Output Compare Channels
6
Input Capture Channels
6
32khz Rtc
Yes
Calibrated Rc Oscillator
No
12.3.2
12.4
64
Debug and Test Pin Description
AT91SAM9XE128/256/512 Preliminary
Test Environment
Figure 12-3 on page 64
preted by the tester. In this example, the “board in test” is designed using a number of JTAG-
compliant devices. These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
NTRST
TCK
TDI
TDO
TMS
RTCK
JTAGSEL
DRXD
DTXD
Debug and Test Pin List
AT91SAM9XE-based Application Board In Test
shows a test environment example. Test vectors are sent and inter-
Connector
ICE/JTAG
AT91SAM9XE
Interface
Function
Microcontroller Reset
Test Mode Select
Test Reset Signal
Test Clock
Test Data In
Test Data Out
Test Mode Select
Returned Test Clock
JTAG Selection
Debug Receive Data
Debug Transmit Data
JTAG
Chip n
ICE and JTAG
Debug Unit
Reset/Test
Test Adaptor
Chip 2
Chip 1
Input/Output
Tester
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Input
6254C–ATARM–22-Jan-10
Active Level
High
Low
Low

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