SAM9XE512 Atmel Corporation, SAM9XE512 Datasheet - Page 799

• Manufacturer Part Number: SAM9XE512
• Manufacturer: Atmel Corporation

Specifications of SAM9XE512

• Flash (kbytes): 512 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 180 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 96
• Ext Interrupts: 96
• Usb Transceiver: 3
• Usb Speed: Full Speed
• Usb Interface: Host, Device
• Spi: 2
• Twi (i2c): 2
• Uart: 6
• Ssc: 1
• Ethernet: 1
• Sd / Emmc: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: Yes
• Adc Channels: 4
• Adc Resolution (bits): 10
• Adc Speed (ksps): 312
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.65 to 1.95
• Fpu: No
• Mpu / Mmu: No / Yes
• Timers: 6
• Output Compare Channels: 6
• Input Capture Channels: 6
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

43. AT91SAM9XE128/256/512 Electrical Characteristics
43.1
Table 43-1.
6254C–ATARM–22-Jan-10
Operating Temperature (Industrial).......... -40⋅ C to +85⋅ C
Storage Temperature ............................... -60°C to +150°C
Voltage on Input Pins
with Respect to Ground .. -0.3V to VDDIO+0.3V(+4V max)
Maximum Operating Voltage
(VDDCORE, VDDPLL and VDDBU)........................... 2.0V
Maximum Operating Voltage
(VDDIOM and VDDIOP) ............................................. 4.0V
Total DC Output Current on all I/O lines ................ 350 mA
Absolute Maximum Ratings
Absolute Maximum Ratings*
AT91SAM9XE128/256/512 Preliminary
*NOTICE:
Stresses beyond those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at these or other conditions beyond those
indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reli-
ability.
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