afs600 Actel Corporation, afs600 Datasheet - Page 174

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afs600

Manufacturer Part Number
afs600
Description
Actel Fusion Programmable System Chips Mixed-signal Family With Optional Arm Support
Manufacturer
Actel Corporation
Datasheet

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The length of time an I/O can withstand I
depends on the junction temperature. The reliability
data below is based on a 3.3 V, 36 mA I/O setting, which
is the worst case for this type of analysis.
For example, at 110°C, the short current condition would
have to be sustained for more than three months to
cause a reliability concern. The I/O design does not
contain any short circuit protection, but such protection
would only be needed in extremely prolonged stress
conditions.
Table 2-97 • Schmitt Trigger Input Hysteresis
Table 2-98 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
2 -1 6 0
Input Buffer
LVTTL/LVCMOS (Schmitt trigger disabled)
LVTTL/LVCMOS (Schmitt trigger enabled)
HSTL/SSTL/GTL
LVDS/BLVDS/M-LVDS/LVPECL
Note: *The maximum input rise/fall time is related only to the noise induced into the input buffer trace. If the noise is low, the rise time
Input Buffer Configuration
3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode)
2.5 V LVCMOS (Schmitt trigger mode)
1.8 V LVCMOS (Schmitt trigger mode)
1.5 V LVCMOS (Schmitt trigger mode)
Actel Fusion Programmable System Chips
and fall time of input buffers, when Schmitt trigger is disabled, can be increased beyond the maximum value. The longer the rise/fall
times, the more susceptible the input signal is to the board noise. Actel recommends signal integrity evaluation/characterization of
the system to ensure there is no excessive noise coupling into input signals.
Hysteresis Voltage Value (typ.) for Schmitt Mode Input Buffers
Input Rise/Fall Time (min.)
OSH
/I
No requirement
No requirement
No requirement
No requirement
OSL
events
A d v a n c e d v 1 . 4
Table 2-96 • Short Current Event Duration before Failure
Temperature
–40°C
25°C
70°C
85°C
100°C
110°C
0°C
No requirement, but input noise voltage
cannot exceed Schmitt hysteresis
Input Rise/Fall Time (max.)
Hysteresis Value (typ.)
10 ns*
10 ns*
10 ns*
240 mV
140 mV
80 mV
60 mV
Time before Failure
>20 years
>20 years
>20 years
6 months
3 months
5 years
2 years
20 years (110°C)
20 years (110°C)
10 years (100°C)
10 years (100°C)
Reliability

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