ST72F324BJ6B6 STMicroelectronics, ST72F324BJ6B6 Datasheet - Page 157

MCU 8BIT 32KB FLASH/ROM 42-SDIP

ST72F324BJ6B6

Manufacturer Part Number
ST72F324BJ6B6
Description
MCU 8BIT 32KB FLASH/ROM 42-SDIP
Manufacturer
STMicroelectronics
Series
ST7r
Datasheet

Specifications of ST72F324BJ6B6

Core Processor
ST7
Core Size
8-Bit
Speed
8MHz
Connectivity
SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
3.8 V ~ 5.5 V
Data Converters
A/D 12x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
42-SDIP (0.600", 15.24mm)
Controller Family/series
ST7
No. Of I/o's
32
Ram Memory Size
1KB
Cpu Speed
8MHz
No. Of Timers
2
Embedded Interface Type
SCI, SPI
No. Of Pwm Channels
3
Processor Series
ST72F3x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
Development Tools By Supplier
ST7232X-EVAL, ST7MDT20-DVP3, ST7MDT20J-EMU3, STX-RLINK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 12 Channel
For Use With
497-6421 - BOARD EVAL DGTL BATT CHGR DESIGN497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
497-5589-5
ST72324Bxx
12.8.3
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: human body model and machine model. This test conforms to the
JESD22-A114A/A115A standard.
Table 104. Absolute maximum ratings
1. Data based on characterization results, not tested in production.
Static latch-up
Table 105. Electrical sensitivities
Symbol
V
V
Symbol
ESD(HBM)
ESD(CDM)
LU
LU: two complementary static tests are required on 6 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard.
Static latch-up class
Electrostatic discharge voltage
(human body model)
Electrostatic discharge voltage
(charged device model)
Parameter
Ratings
T
T
T
A
A
A
= +25 °C
= +85 °C
= +125 °C
Conditions
T
A
= +25 °C
Conditions
specification
JESD 78
Electrical characteristics
Test
Maximum value
2000
750
II level A
Class
(1)
157/193
Unit
V

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