AT91SAM9RL64-CU Atmel, AT91SAM9RL64-CU Datasheet - Page 70

IC ARM9 MCU 217-LFBGA

AT91SAM9RL64-CU

Manufacturer Part Number
AT91SAM9RL64-CU
Description
IC ARM9 MCU 217-LFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheets

Specifications of AT91SAM9RL64-CU

Core Processor
ARM9
Core Size
16/32-Bit
Speed
240MHz
Connectivity
EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
Peripherals
AC'97, LCD, POR, PWM, WDT
Number Of I /o
118
Program Memory Size
32KB (32K x 8)
Program Memory Type
ROM
Ram Size
72K x 8
Voltage - Supply (vcc/vdd)
1.08 V ~ 1.32 V
Data Converters
A/D 6x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
217-LFBGA
Processor Series
AT91SAMx
Core
ARM926EJ-S
Data Bus Width
32 bit
Data Ram Size
64 KB
Interface Type
2-Wire, SPI, SSC, USART
Maximum Clock Frequency
240 MHz
Number Of Programmable I/os
118
Number Of Timers
4
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 6 Channel
Controller Family/series
AT91SAM9xxx
No. Of I/o's
118
Ram Memory Size
64KB
Cpu Speed
240MHz
No. Of Timers
1
Rohs Compliant
Yes
Package
217LFBGA
Device Core
ARM926EJ-S
Family Name
91S
Maximum Speed
240 MHz
Operating Supply Voltage
1.8|3.3 V
For Use With
AT91SAM9RL-EK - KIT EVAL FOR AT91SAM9RLAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

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13.4
13.5
13.5.1
13.5.2
6289C–ATARM–28-May-09
Debug and Test Pin Description
Functional Description
Test Pin
Embedded In-circuit Emulator
Table 13-1.
One dedicated pin, TST, is used to define the device operating mode. The user must make sure
that this pin is tied at low level to ensure normal operating conditions. Other values associated
with this pin are reserved for manufacturing test.
The ARM9EJ-S Embedded In-Circuit Emulator-RT is supported via the ICE/JTAG port. It is con-
nected to a host computer via an ICE interface. Debug support is implemented using an
ARM9EJ-S core embedded within the ARM926EJ-S. The internal state of the ARM926EJ-S is
examined through an ICE/JTAG port which allows instructions to be serially inserted into the
pipeline of the core without using the external data bus. Therefore, when in debug state, a store-
multiple (STM) can be inserted into the instruction pipeline. This exports the contents of the
ARM9EJ-S registers. This data can be serially shifted out without affecting the rest of the
system.
There are two scan chains inside the ARM9EJ-S processor which support testing, debugging,
and programming of the Embedded ICE-RT
port.
Embedded ICE mode is selected when JTAGSEL is low. It is not possible to switch directly
between ICE and JTAG operations. A chip reset must be performed after JTAGSEL is changed.
For further details on the Embedded In-Circuit-Emulator-RT, see the ARM document:
ARM9EJ-S Technical Reference Manual (DDI 0222A).
Pin Name
NTRST
NRST
TST
TCK
TDI
TDO
TMS
RTCK
JTAGSEL
DRXD
DTXD
Debug and Test Pin List
Function
Test Reset Signal
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
Returned Test Clock
JTAG Selection
Debug Receive Data
Debug Transmit Data
AT91SAM9R64/RL64 Preliminary
ICE and JTAG
Debug Unit
Reset/Test
. The scan chains are controlled by the ICE/JTAG
Input/Output
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Input
Active Level
High
Low
Low
70

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