ATSAM3U4CA-CU Atmel, ATSAM3U4CA-CU Datasheet - Page 233

• Manufacturer Part Number: ATSAM3U4CA-CU
• Description: IC MCU 32BIT 256KB FLSH 100TFBGA
• Manufacturer: Atmel
• Series: SAM3Ur

Specifications of ATSAM3U4CA-CU

• Core Processor: ARM® Cortex-M3™
• Core Size: 32-Bit
• Speed: 96MHz
• Connectivity: EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, I²S, POR, PWM, WDT
• Number Of I /o: 57
• Program Memory Size: 256KB (256K x 8)
• Program Memory Type: FLASH
• Ram Size: 52K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 4x10b, 4x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-TFBGA
• Processor Series: ATSAM3x
• Core: ARM Cortex M3
• Data Bus Width: 32 bit
• Data Ram Size: 52 KB
• Interface Type: 3xUSART, TWI, 4xSPI, Bus
• Maximum Clock Frequency: 96 MHz
• Number Of Programmable I/os: 57
• Number Of Timers: 8
• Operating Supply Voltage: 1.62 V to 3.6 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JTRACE-CM3, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: ATSAM3U-EK
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

14.3
14.4
14.4.1
6430D–ATARM–25-Mar-11
Debug and Test Pin Description
Functional Description
Test Pin
Figure 14-3. Application Test Environment Example
Table 14-1.
Note:
One dedicated pin, TST, is used to define the device operating mode. When this pin is at low
level during power-up, the device is in normal operating mode. When at high level, the device is
in test mode or FFPI mode. The TST pin integrates a permanent pull-down resistor of about
15 kΩ, so that it can be left unconnected for normal operation. Note that when setting the TST pin
Signal Name
NRST
TST
TCK/SWCLK
TDI
TDO/TRACESWO
TMS/SWDIO
JTAGSEL
1. TDO pin is set in input mode when the Cortex-M3 Core is not in debug mode. Thus an external
pull-up (100 kΩ) must be added to avoid current consumption due to floating input.
Debug and Test Signal List
SAM3-based Application Board In Test
Connector
JTAG
Probe
JTAG
Function
Microcontroller Reset
Test Select
Test Clock/Serial Wire Clock
Test Data In
Test Data Out/Trace Asynchronous
Data Out
Test Mode Select/Serial Wire
Input/Output
JTAG Selection
SAM3
Chip n
SWD/JTAG
Reset/Test
Test Adaptor
Chip 2
Chip 1
Tester
Input/Output
Output
Type
Input
Input
Input
Input
Input
SAM3U Series
(1)
Active Level
High
Low
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