AMD-K6-2E/400AFR AMD [Advanced Micro Devices], AMD-K6-2E/400AFR Datasheet - Page 143

• Manufacturer Part Number: AMD-K6-2E/400AFR
• Manufacturer: AMD [Advanced Micro Devices]

22529B/0—January 2000
5.49
Pin Attribute
Pin Location
Summary
Sampled
5.50
Pin Attribute
Pin Location
Summary
Sampled
Chapter 5
TMS (Test Mode Select)
TRST# (Test Reset)
Input, Internal Pullup
P-34
TMS specifies the test function and sequence of state changes
for boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 229 for details
regarding the operation of the TAP controller.
The processor samples TMS on every rising TCK edge. If TMS is
sampled High for five or more consecutive clocks, the TAP
controller enters its Test-Logic-Reset state, regardless of the
controller state. This action is the same as that achieved by
asserting TRST#.
Input, Internal Pullup
Q-33
The assertion of TRST# initializes the Test Access Port (TAP) by
resetting its state machine to the Test-Logic-Reset state. See
“Boundary-Scan Test Access Port (TAP)” on page 229 for details
regarding the operation of the TAP controller.
TRST# is a completely asynchronous input that does not
require a minimum setup and hold time relative to TCK. See
Ta b l e 6 4 o n p a g e 2 8 0 f o r t h e m i n i m u m p u l s e w i d t h
requirement.
Signal Descriptions
AMD-K6™-2E Processor Data Sheet
125