AMD-K6-2E/400AFR AMD [Advanced Micro Devices], AMD-K6-2E/400AFR Datasheet - Page 246

• Manufacturer Part Number: AMD-K6-2E/400AFR
• Manufacturer: AMD [Advanced Micro Devices]

AMD-K6™-2E Processor Data Sheet
12.2
228
Three-State Test Mode
The three-state test mode causes the processor to float its
output and bidirectional pins, which is useful for board-level
manufac turing t esting . I n t his m ode, t he processo r is
electrically isolated from other components on a system board,
allowing automated test equipment (ATE) to test components
that drive the same signals as those the processor floats.
If the FLUSH# signal is sampled Low during the falling
transition of RESET, the processor enters the three-state test
mode. (See “FLUSH# (Cache Flush)” on page 104 for the
specific sampling requirements.) The signals floated in the
three-state test mode are as follows:
The VCC2DET, VCC2H/L#, and TDO signals are the only
outputs not floated in the three-state test mode.
The three-state test mode is exited when the processor samples
RESET asserted.
VCC2DET and VCC2H/L# must remain Low to ensure the
system continues to supply the specified processor core
voltage to the V
TDO is never floated because the boundary-scan Test Access
Port must remain enabled at all times, including during the
three-state test mode.
A[31:3]
ADS#
ADSC#
AP
APCHK#
BE[7:0]#
BREQ
CACHE#
Preliminary Information
Test and Debug
CC2
D/C#
D[63:0]
DP[7:0]
FERR#
HIT#
HITM#
HLDA
LOCK#
pins.
M/IO#
PCD
PCHK#
PWT
SCYC
SMIACT#
W/R#
22529B/0—January 2000
Chapter 12