MCF5214CVF66 Freescale Semiconductor, MCF5214CVF66 Datasheet - Page 666

IC MPU 32BIT COLDF 256-MAPBGA

MCF5214CVF66

Manufacturer Part Number
MCF5214CVF66
Description
IC MPU 32BIT COLDF 256-MAPBGA
Manufacturer
Freescale Semiconductor
Series
MCF521xr
Datasheet

Specifications of MCF5214CVF66

Core Processor
Coldfire V2
Core Size
32-Bit
Speed
66MHz
Connectivity
CAN, EBI/EMI, I²C, SPI, UART/USART
Peripherals
DMA, LVD, POR, PWM, WDT
Number Of I /o
142
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
64K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
256-MAPBGA
Package
256MA-BGA
Device Core
ColdFire
Family Name
MCF521x
Maximum Speed
66 MHz
Operating Supply Voltage
3.3 V
Data Bus Width
32 Bit
Number Of Programmable I/os
142
Interface Type
QSPI/UART/I2C/CAN
On-chip Adc
8-chx10-bit
Number Of Timers
8
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-

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IEEE 1149.1 Test Access Port (JTAG)
31.1
The basic features of the JTAG module are the following:
31.2
The JTAG_EN pin can select between the following modes of operation:
31.3
The JTAG module has five input and one output external signals, as described in
31.3.1
31.3.1.1 JTAG_EN — JTAG Enable
The JTAG_EN pin selects between Debug module and JTAG. If JTAG_EN is low, the Debug module is
selected; if it is high, the JTAG is selected.
upon JTAG_EN logic state.
31-2
TRST/DSCLK
TMS/BKPT
TDO/DSO
JTAG_EN
TDI/DSI
Name
TCLK
Performs boundary-scan operations to test circuit board electrical continuity
Bypasses instruction to reduce the shift register path to a single cell
Sets chip output pins to safety states while executing the bypass instruction
Samples the system pins during operation and transparently shift out the result
Selects between JTAG TAP controller and Background Debug Module (BDM) using a dedicated
JTAG_EN pin
JTAG mode
BDM - background debug mode (For more information, refer to
Mode
Features
Modes of Operation
External Signal Description
Detailed Signal Description
(BDM)).”
Direction
Output
Input
Input
Input
Input
Input
MCF5282 and MCF5216 ColdFire Microcontroller User’s Manual, Rev. 3
JTAG Test data output / BDM Development serial output
JTAG Test reset input / BDM Development serial clock
JTAG Test data input / BDM Development serial input
JTAG Test mode select / BDM Breakpoint
Table 31-2. Pin Function Selected
Table 31-1. Signal Properties
JTAG_EN = 0
JTAG/BDM selector input
JTAG Test clock input
Table 31-2
Function
summarizes the pin function selected depending
JTAG_EN = 1
Section 30.5, “Background Debug
Reset State
Pin Name
Hi-Z / 0
Table
Freescale Semiconductor
31-1.
Pull up
Active
Active
Active
Active

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