EP9302-CQZ Cirrus Logic Inc, EP9302-CQZ Datasheet - Page 769

IC ARM9 SOC PROCESSOR 208LQFP

EP9302-CQZ

Manufacturer Part Number
EP9302-CQZ
Description
IC ARM9 SOC PROCESSOR 208LQFP
Manufacturer
Cirrus Logic Inc
Series
EP9r
Datasheets

Specifications of EP9302-CQZ

Program Memory Type
ROMless
Package / Case
208-LQFP
Core Processor
ARM9
Core Size
16/32-Bit
Speed
200MHz
Connectivity
EBI/EMI, Ethernet, I²C, IrDA, SPI, UART/USART, USB
Peripherals
AC'97, DMA, I&sup2:S, LED, MaverickKey, POR, PWM, WDT
Number Of I /o
19
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 3.6 V
Data Converters
A/D 5x12b
Oscillator Type
External
Operating Temperature
0°C ~ 70°C
Processor Series
EP93xx
Core
ARM920T
Data Bus Width
32 bit
Data Ram Size
16 bit
Interface Type
USB, USART, SPI
Maximum Clock Frequency
200 MHz
Number Of Programmable I/os
37
Mounting Style
SMD/SMT
3rd Party Development Tools
MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
EDB9302A-Z
Controller Family/series
(ARM9)
No. Of I/o's
19
Ram Memory Size
16MB
Cpu Speed
200MHz
No. Of Timers
4
Embedded Interface Type
AC97, I2S, SPI, UART, USB
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
598-1132 - KIT DEVELOPMENT EP9302 ARM9
Eeprom Size
-
Program Memory Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
598-1137

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DS785UM1
Address:
Default:
Definition:
Bit Descriptions:
0x808F_0000
0x0000_0000
Key scan initialization register.
RSVD:
DBNC:
DIS3KY:
DIAG:
BACK:
T2:
NA:
Copyright 2007 Cirrus Logic
Reserved. Unknown during read.
De-bounce start count. This value is used to pre-load the
de-bounce counter. The de-bounce counter counts the
number of consecutive scans that decoded the same
keys. Terminal count for the de-bounce counter is 0xFF.
Terminal count indirectly generates a key scan interrupt. A
pre-load value of 0xFC will cause the key scan circuitry to
count 3 identical consecutive keypad scans.
Disable 3 Key reset. Setting this bit high disables the three
key reset output to the watchdog reset block. Setting it
back low re-enables it.
Key scan diagnostic mode. Setting this bit high allows key
scanning to be directly controlled through the key register
by writes from the ARM Core. The DIAG.KEY[5:0] value is
written by the ARM Core. Then the KeyRegister.K bit is
read to determine if there is a key press. The result from
reading the KeyRegister.K bit is not hardware de-bounced.
Key scan back driving enable. Setting this bit high enables
the key scanning logic to back drive the row and column
pins of the chip high during the first two column counts in
the row/column counter.
Test mode bit. When this bit is set to “1”, the counter
RC_COUNT is advanced by 8 counts when EN is active.
The effect is that only column 0 is checked in each row.
This test mode allows a faster test of the ROW pins.
Not Assigned. These bits will read back the value written.
EP93xx User’s Guide
Keypad Interface
26-7
26

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