PIC18F46J50-I/PT Microchip Technology, PIC18F46J50-I/PT Datasheet - Page 405

IC PIC MCU FLASH 64KB 44-TQFP

PIC18F46J50-I/PT

Manufacturer Part Number
PIC18F46J50-I/PT
Description
IC PIC MCU FLASH 64KB 44-TQFP
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Datasheets

Specifications of PIC18F46J50-I/PT

Core Size
8-Bit
Program Memory Size
64KB (32K x 16)
Core Processor
PIC
Speed
48MHz
Connectivity
I²C, SPI, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
34
Program Memory Type
FLASH
Ram Size
3.8K x 8
Voltage - Supply (vcc/vdd)
2.15 V ~ 3.6 V
Data Converters
A/D 13x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
44-TQFP, 44-VQFP
Controller Family/series
PIC18
No. Of I/o's
22
Ram Memory Size
3.6875KB
Cpu Speed
48MHz
No. Of Timers
2
No. Of Pwm Channels
2
Package
44TQFP
Device Core
PIC
Family Name
PIC18
Maximum Speed
48 MHz
Operating Supply Voltage
2.5|3.3 V
Data Bus Width
8 Bit
Interface Type
I2C/SPI/USART/USB
On-chip Adc
13-chx10-bit
Number Of Timers
5
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
AC164330 - MODULE SKT FOR 44TQFP 18F45J10
Eeprom Size
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant

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0
25.4
There are two separate methods of measuring capaci-
tance with the CTMU. The first is the absolute method,
in which the actual capacitance value is desired. The
second is the relative method, in which the actual
capacitance is not needed, rather an indication of a
change in capacitance is required.
25.4.1
For absolute capacitance measurements, both the
current and capacitance calibration steps found in
Section 25.3 “Calibrating the CTMU Module”
should be followed. Capacitance measurements are
then performed using the following steps:
1.
2.
3.
4.
5.
6.
7.
8.
© 2009 Microchip Technology Inc.
Initialize the A/D Converter.
Initialize the CTMU.
Set EDG1STAT.
Wait for a fixed delay, T.
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the total capacitance, C
where I is known from the current source
measurement step (see Section 25.3.1 “Current
Source Calibration”), T is a fixed delay and V is
measured by performing an A/D conversion.
Subtract the stray and A/D capacitance
(C
Calibration”) from C
measured capacitance.
OFFSET
Measuring Capacitance with the
CTMU
ABSOLUTE CAPACITANCE
MEASUREMENT
from Section 25.3.2 “Capacitance
TOTAL
to determine the
TOTAL
= (I * T)/V,
PIC18F46J50 FAMILY
25.4.2
An application may not require precise capacitance
measurements. For example, when detecting a valid
press of a capacitance-based switch, detecting a rela-
tive change of capacitance is of interest. In this type of
application, when the switch is open (or not touched),
the total capacitance is the capacitance of the combina-
tion of the board traces, the A/D Converter, etc. A larger
voltage will be measured by the A/D Converter. When
the switch is closed (or is touched), the total
capacitance is larger due to the addition of the
capacitance of the human body to the above listed
capacitances, and a smaller voltage will be measured
by the A/D Converter.
Detecting capacitance changes is easily accomplished
with the CTMU using these steps:
1.
2.
3.
4.
5.
The voltage measured by performing the A/D conver-
sion is an indication of the relative capacitance. Note
that in this case, no calibration of the current source or
circuit capacitance measurement is needed. See
Example 25-4 for a sample software routine for a
capacitive touch switch.
Initialize the A/D Converter and the CTMU.
Set EDG1STAT.
Wait for a fixed delay.
Clear EDG1STAT.
Perform an A/D conversion.
RELATIVE CHARGE
MEASUREMENT
DS39931C-page 405

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