mc9s12q128 Freescale Semiconductor, Inc, mc9s12q128 Datasheet - Page 624

• Manufacturer Part Number: mc9s12q128
• Description: Hcs12 Microcontrollers
• Manufacturer: Freescale Semiconductor, Inc

Appendix A Electrical Characteristics
A.5.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to
3. Spec table quotes typical endurance evaluated at 25 C for this product family, typical endurance at various temperature can
624
Conditions are shown in Table A-4. unless otherwise noted
Num C
application.
25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please refer
to Engineering Bulletin EB618.
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer to
Engineering Bulletin EB619.
1
2
3
4
Javg
will not exeed 85 C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention after 10,000 program/erase cycles at an
C Data retention with <100 program/erase cycles at an
C Number of program/erase cycles
C Number of program/erase cycles
average junction temperature of T
average junction temperature T
(–40 C
(0 C
NVM Reliability
T
J
T
J
140 C)
0 C)
Table A-19. NVM Reliability Characteristics
Rating
Javg
Javg
Flash Reliability Characteristics
85 C
85 C
MC9S12Q128
Rev 1.09
Symbol
t
FLRET
n
FL
10,000
10,000
Min
15
20
(1)
100,000
100
100
Typ
—
(2)
2
Freescale Semiconductor
(3)
Max
—
—
—
—
Cycles
Years
Unit