SI4431-A0-FM Silicon Laboratories Inc, SI4431-A0-FM Datasheet - Page 15

IC TXRX ISM 930MHZ 3.6V 20-QFN

SI4431-A0-FM

Manufacturer Part Number
SI4431-A0-FM
Description
IC TXRX ISM 930MHZ 3.6V 20-QFN
Manufacturer
Silicon Laboratories Inc
Datasheets

Specifications of SI4431-A0-FM

Package / Case
20-QFN
Mfg Application Notes
Transitioning SI4430/31 to Rev B
Frequency
240MHz ~ 930MHz
Data Rate - Maximum
128kbps
Modulation Or Protocol
FSK, GFSK, OOK
Power - Output
13dBm
Sensitivity
-118dBm
Voltage - Supply
1.8 V ~ 3.6 V
Current - Receiving
18.5mA
Current - Transmitting
28mA
Data Interface
PCB, Surface Mount
Antenna Connector
PCB, Surface Mount
Operating Temperature
-40°C ~ 85°C
Number Of Receivers
2
Number Of Transmitters
1
Wireless Frequency
240 MHz to 930 MHz
Output Power
13 dBm
Operating Supply Voltage
1.8 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Maximum Supply Current
28 mA
Minimum Operating Temperature
- 40 C
Modulation
FSK, GFSK, OOK
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Applications
-
Memory Size
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
336-1633-5

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Manufacturer
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Price
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Manufacturer:
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1.1. Definition of Test Conditions
Production Test Conditions:
T
V
External reference signal (XIN) = 1.0 V
Production test schematic (unless noted otherwise)
All RF input and output levels referred to the pins of the Si4431 (not the RF module)
Extreme Test Conditions:
T
V
External reference signal (XIN) = 0.7 to 1.6 V
Production test schematic (unless noted otherwise)
All RF input and output levels referred to the pins of the Si4431 (not the RF module)
Test Notes:
All electrical parameters with Min/Max values are guaranteed by one (or more) of the following test methods.
Electrical parameters shown with only Typical values are not guaranteed.
A
A
DD
DD
= –40 to +85 °C
= +25 °C
Guaranteed by design and/or simulation but not tested.
Guaranteed by Engineering Qualification testing at Extreme Test Conditions.
Guaranteed by 100% Production Test Screening at Production Test Conditions.
= +3.3 VDC
= +1.8 to +3.6 VDC
PP
at 30 MHz, centered around 0.8 VDC
PP
Preliminary Rev. 0.4
at 30 MHz centered around 0.8 VDC
Si4431
15

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