MC9S12P32CFT Freescale Semiconductor, MC9S12P32CFT Datasheet - Page 523

• Manufacturer Part Number: MC9S12P32CFT
• Description: MCU 16BIT 32K FLASH 48-QFN
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12P32CFT

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 32MHz
• Connectivity: CAN, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 34
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 4K x 8
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 1.72 V ~ 5.5 V
• Data Converters: A/D 10x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 48-QFN Exposed Pad
• Processor Series: S12P
• Core: HCS12
• 3rd Party Development Tools: EWHCS12
• Development Tools By Supplier: KIT33812ECUEVME, DEMO9S12PFAME
• Package: 48QFN EP
• Family Name: HCS12
• Maximum Speed: 32 MHz
• Operating Supply Voltage: 3.3|5 V
• Data Bus Width: 16 Bit
• Interface Type: CAN/SCI/SPI
• On-chip Adc: 10-chx12-bit
• Number Of Timers: 8
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

A.4
A.4.1
With each transition of the feedback clock, the deviation from the reference clock is measured and input
voltage to the VCO is adjusted accordingly.The adjustment is done continuously with no abrupt changes
in the VCOCLK frequency. Noise, voltage, temperature and other factors cause slight variations in the
control loop resulting in a clock jitter. This jitter affects the real minimum and maximum clock periods as
illustrated in
Freescale Semiconductor
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
3. Spec table quotes typical endurance evaluated at 25°C for this product family. For additional information on how Freescale
Conditions are shown in
Num C
application.
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618
defines Typical Endurance, please refer to Engineering Bulletin EB619.
1
2
3
4
5
6
Javg
does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention at an average junction temperature of T
C Program Flash number of program/erase cycles
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data Flash number of program/erase cycles (-40°C ≤ tj ≤ 150°C)
Phase Locked Loop
85°C
(-40°C ≤ tj ≤ 150°C)
85°C
85°C
85°C
Jitter Definitions
Figure
(1)
1
1
1
All values shown in
characterization.
after up to 50,000 program/erase cycles
after up to 10,000 program/erase cycles
after less than 100 program/erase cycles
after up to 10,000 program/erase cycles
A-2.
Table A-4
unless otherwise noted
Table A-19. NVM Reliability Characteristics
Rating
S12P-Family Reference Manual, Rev. 1.13
Table A-19
Program Flash Arrays
Data Flash Array
are preliminary and subject to further
NOTE
Javg
Javg
Javg
Javg
=
=
=
=
Symbol
t
t
t
t
NVMRET
NVMRET
NVMRET
NVMRET
n
n
FLPE
FLPE
10K
50K
Min
20
10
20
5
100K
500K
100
100
100
100
Typ
Electrical Characteristics
(2)
2
2
2
(3)
3
Max
—
—
—
—
—
—
Cycles
Cycles
Years
Years
Years
Years
Unit
523