S9S12HZ128J3VAL Freescale Semiconductor, S9S12HZ128J3VAL Datasheet - Page 638

IC MCU FLASH 112-LQFP

S9S12HZ128J3VAL

Manufacturer Part Number
S9S12HZ128J3VAL
Description
IC MCU FLASH 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheet

Specifications of S9S12HZ128J3VAL

Core Processor
HCS12
Core Size
16-Bit
Speed
25MHz
Connectivity
CAN, EBI/EMI, I²C, SCI, SPI
Peripherals
LCD, Motor control PWM, POR, PWM, WDT
Number Of I /o
91
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Eeprom Size
2K x 8
Ram Size
6K x 8
Voltage - Supply (vcc/vdd)
2.35 V ~ 2.75 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 105°C
Package / Case
112-LQFP
Processor Series
S12HY
Core
HCS12X
Data Bus Width
16 bit
Data Ram Size
6 KB
Interface Type
CAN, I2C, SCI, SPI
Maximum Clock Frequency
50 MHz
Number Of Programmable I/os
85
Number Of Timers
1
Operating Supply Voltage
4.5 V to 5.5 V
Maximum Operating Temperature
+ 105 C
Mounting Style
SMD/SMT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
S9S12HZ128J3VAL
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Part Number:
S9S12HZ128J3VAL
Manufacturer:
FREESCALE
Quantity:
20 000
Part Number:
S9S12HZ128J3VAL(MC9S12HZ128VAL
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FREESCALE
Quantity:
20 000
Appendix A Electrical Characteristics
A.3.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
638
Conditions are shown in
Num C
1
2
3
4
C Data Retention at an average junction temperature of
C Flash number of Program/Erase cycles
C EEPROM number of Program/Erase cycles
C EEPROM number of Program/Erase cycles
T
(–40 C
(0 C < T
Javg
NVM Reliability
= 70 C
All values shown in
extensive characterization.
J
T
J
140 C)
Table A-4
0 C)
Rating
unless otherwise noted
Table A-12. NVM Reliability Characteristics
Table A-12
MC9S12HZ256 Data Sheet, Rev. 2.05
are target values and subject to further
NOTE
t
Symbol
NVMRET
n
n
n
EEPE
EEPE
FLPE
100,000
10,000
1000
Min
15
10,000
Typ
Freescale Semiconductor
Max
Cycles
Cycles
Cycles
Years
Unit

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