PEB2256H-V12 Infineon Technologies, PEB2256H-V12 Datasheet - Page 58

• Manufacturer Part Number: PEB2256H-V12
• Description: IC INTERFACE LINE 3.3V 80-MQFP
• Manufacturer: Infineon Technologies

Specifications of PEB2256H-V12

• Applications: *
• Interface: *
• Voltage - Supply: *
• Package / Case: 80-SQFP
• Mounting Type: Surface Mount
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: PEB2256H-V12; PEB2256H-V12IN

If no boundary scan operation is used, TRS has to be connected to RST or V
TCK and TDI do not need to be connected since pullup transistors ensure high input
levels in this case.
Test handling (boundary scan operation) is performed using the pins TCK (Test Clock),
TMS (Test Mode Select), TDI (Test Data Input) and TDO (Test Data Output) when the
TAP controller is not in its reset state, that means TRS is connected to V
unconnected due to its internal pull up. Test data at TDI is loaded with a clock signal
connected to TCK. "1" or "0" on TMS causes a transition from one controller state to
another; constant "1" on TMS leads to normal operation of the chip.
An input pin (I) uses one boundary scan cell (data in), an output pin (O) uses two cells
(data out and enable) and an I/O-pin (I/O) uses three cells (data in, data out and enable).
Note that most functional output and input pins of the FALC56 are tested as I/O pins in
boundary scan, hence using three cells. The desired test mode is selected by serially
loading a 8-bit instruction code into the instruction register through TDI (LSB first).
EXTEST is used to examine the interconnection of the devices on the board. In this test
mode at first all input pins capture the current level on the corresponding external
interconnection line, whereas all output pins are held at constant values ("0" or "1"). Then
the contents of the boundary scan is shifted to TDO. At the same time the next scan
vector is loaded from TDI. Subsequently all output pins are updated according to the new
boundary scan contents and all input pins again capture the current external level
afterwards, and so on.
SAMPLE is a test mode which provides a snapshot of pin levels during normal operation.
IDCODE: A 32-bit identification register is serially read out on pin TDO. It contains the
version number (4 bits), the device code (16 bits) and the manufacturer code (11 bits).
The LSB is fixed to "1".
The ID code field is set to: 0001 0000 0000 0101 1001 0000 1000 0011
Version = 3
BYPASS: A bit entering TDI is shifted to TDO after one TCK clock cycle.
An alphabetical overview of all TAP controller operation codes is given in
Table 9
TAP Instruction
BYPASS
EXTEST
IDCODE
SAMPLE
reserved for device test
Data Sheet
H,
Part Number = 0059
TAP Controller Instruction Codes
H
, Manufacturer = 083
58
00000000
Instruction Code
11111111
00000100
00000001
01010011
Functional Description E1/T1/J1
H
(including LSB, fixed to "1")
FALC56 V1.2
DD
Table
or it remains
PEB 2256
2002-08-27
SS
9.
. TMS,