SAM3U1C Atmel Corporation, SAM3U1C Datasheet - Page 230

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SAM3U1C

Manufacturer Part Number
SAM3U1C
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM3U1C

Flash (kbytes)
64 Kbytes
Pin Count
100
Max. Operating Frequency
96 MHz
Cpu
Cortex-M3
# Of Touch Channels
28
Hardware Qtouch Acquisition
No
Max I/o Pins
57
Ext Interrupts
57
Usb Transceiver
1
Quadrature Decoder Channels
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
4
Twi (i2c)
1
Uart
4
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
12
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
20
Self Program Memory
YES
External Bus Interface
1
Dram Memory
No
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
14.2
14.2.1
14.2.2
230
Application Examples
SAM3U Series
Debug Environment
Test Environment
Figure 14-2
standard debugging functions, such as downloading code and single-stepping through the pro-
gram and viewing core and peripheral registers.
Figure 14-2. Application Debug Environment Example
Figure 14-3
and interpreted by the tester. In this example, the “board in test” is designed using a number of
JTAG-compliant devices. These devices can be connected to form a single scan chain.
shows a complete debug environment example. The SWJ-DP interface is used for
shows a test environment example (JTAG Boundary scan). Test vectors are sent
SAM3-based Application Board
Emulator/Probe
Connector
SWJ-DP
SWJ-DP
SAM3
Host Debugger
PC
6430E–ATARM–29-Aug-11

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