MT29F128G08WAAC6 Micron, MT29F128G08WAAC6 Datasheet - Page 51

• Manufacturer Part Number: MT29F128G08WAAC6
• Description: NAND Flash Memory
• Manufacturer: Micron

Features Operations
Table 12:
GET FEATURES EEh
PDF: 09005aef8278ee3f / Source: 09005aef81f17540
16gb_nand_mlc_l52a__2.fm -Rev. D 5/08 EN
Features Table
The GET FEATURES (EEh) and SET FEATURES (EFh) commands are used to alter NAND
Flash device default power-on behaviors. These commands use a one-byte feature
address to determine which subfeature parameters are to be read or modified. Each fea-
ture address (in the range of 00h to FFh) is defined in Table 12. The GET FEATURES com-
mand reads the subfeature parameters (P1–P4) at the specified feature address. The SET
FEATURES (EFh) command places subfeature parameters (P1–P4) at the specified fea-
ture address.
The GET FEATURES command is used to return the current subfeature parameters (see
Table 13 on page 52) at the specified feature address. Figure 32 on page 53 defines GET
FEATURES behavior and timing.
R/B# goes LOW (
specified feature address. The READ STATUS (70h) command and the RESET (FFh) com-
mand are the only commands available during GET FEATURES operation. Bits 5 and 6 of
the status register will reflect the state of R/B#.
Feature Address Definition
00h
01h
02h–7Fh
80h
81h
82h-FFh
Micron Confidential and Proprietary
t
FEAT) while the subfeature parameters are being loaded from the
Reserved
Timing mode
Reserved
Programmable I/O drive strength
Programmable R/B# pull-down strength
Reserved
51
www.DataSheet.net/
16, 32, 64, 128Gb NAND Flash Memory
Micron Technology, Inc., reserves the right to change products or specifications without notice.
Command Definitions
©2005 Micron Technology, Inc. All rights reserved.
Datasheet pdf - http://www.DataSheet4U.co.kr/