MT29F128G08WAAC6 Micron, MT29F128G08WAAC6 Datasheet - Page 54

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MT29F128G08WAAC6

Manufacturer Part Number
MT29F128G08WAAC6
Description
NAND Flash Memory
Manufacturer
Micron
Datasheet
SET FEATURES EFh
Figure 33:
PDF: 09005aef8278ee3f / Source: 09005aef81f17540
16gb_nand_mlc_l52a__2.fm -Rev. D 5/08 EN
SET FEATURES Operation
WE#
R/B#
I/Ox
CE#
ALE
RE#
CLE
Notes: 1. P1–P4 are the subfeature parameters to be written to the specified feature address (FA).
EFh
The SET FEATURES command is used to set the subfeature parameters at a specified
feature address. These parameters are stored in the device until the device is powered
down. The subfeature parameters are applied to all die on the CE# to which this com-
mand is issued. Figure 33 depicts SET FEATURES behavior and timing.
After all four subfeature parameters, P1–P4, are issued, R/B# goes LOW for
the subfeature parameters are written to the specified feature address. The READ STA-
TUS (70h) command and the RESET (FFh) command are the only valid commands dur-
ing SET FEATURES operation. Bits 5 and 6 of the status register will reflect the state of
R/B#.
Feature address,
Micron Confidential and Proprietary
1 cycle
FA
t ADL
P1
1
54
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P2
16, 32, 64, 128Gb NAND Flash Memory
Micron Technology, Inc., reserves the right to change products or specifications without notice.
P3
P4
Command Definitions
©2005 Micron Technology, Inc. All rights reserved.
t FEAT
t
FEAT while
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