DF2166VT33WV Renesas Electronics America, DF2166VT33WV Datasheet - Page 831
DF2166VT33WV
Manufacturer Part Number
DF2166VT33WV
Description
MCU 16BIT FLASH 3V 512K 144-TQFP
Manufacturer
Renesas Electronics America
Series
H8® H8S/2100r
Datasheet
1.HS2168EPI61H-U.pdf
(876 pages)
Specifications of DF2166VT33WV
Core Processor
H8S/2000
Core Size
16-Bit
Speed
33MHz
Connectivity
I²C, IrDA, LPC, SCI, SmartCard
Peripherals
POR, PWM, WDT
Number Of I /o
106
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
40K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 8x10b; D/A 2x8b
Oscillator Type
External
Operating Temperature
-20°C ~ 75°C
Package / Case
144-TQFP, 144-VQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
DF2166VT33WV
Manufacturer:
Renesas Electronics America
Quantity:
135
Company:
Part Number:
DF2166VT33WV
Manufacturer:
Renesas Electronics America
Quantity:
10 000
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Table 25.5 External Clock Input Conditions
Condition: VCC = 3.0 V to 3.6 V, VSS = 0 V, φ = 5 MHz to 33 MHz
Note:
Table 25.6 Subclock Input Conditions
Condition: VCC = 3.0 V to 3.6 V, VSS = 0 V, φ SUB = 32.768 kHz, 5 MHz to 33 MHz
Item
External clock input low level
pulse width
External clock input high level
pulse width
External clock input rising time t
External clock input falling time t
Clock low level pulse width
Clock high level pulse width
External clock output
stabilization delay time
Item
Subclock input low level pulse
width
Subclock input high level pulse
width
Subclock input rising time
Subclock input falling time
Clock low level pulse width
Clock high level pulse width
*
t
DEXT
includes a RES pulse width (t
φ
Figure 25.4 System Clock Timing
Symbol
t
t
t
t
t
Symbol
t
t
t
t
t
t
EXL
EXH
EXr
EXf
CL
CH
DEXT
EXCLL
EXCLH
EXCLr
EXCLf
CL
CH
*
Min.
0.4
0.4
t
RESW
CH
Min.
10
10
0.4
0.4
500
).
t
cyc
t
Cf
t
CL
Typ.
15.26
15.26
t
Max.
Cr
5
5
0.6
0.6
Max.
10
10
0.6
0.6
Rev. 3.00, 03/04, page 789 of 830
Unit
ns
ns
ns
ns
t
t
µs
cyc
cyc
Unit
µs
µs
ns
ns
t
t
cyc
cyc
Test
Conditions
Figure 25.7
Figure 25.4
Figure 25.8
Measureme
nt Condition
Figure 25.9
Figure 25.4
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