DK-DEV-3SL150N Altera, DK-DEV-3SL150N Datasheet - Page 7

KIT DEVELOPMENT STRATIX III

DK-DEV-3SL150N

Manufacturer Part Number
DK-DEV-3SL150N
Description
KIT DEVELOPMENT STRATIX III
Manufacturer
Altera
Series
Stratix® IIIr
Type
FPGAr

Specifications of DK-DEV-3SL150N

Contents
Development Platform, Cables and Software
Silicon Manufacturer
Altera
Core Architecture
FPGA
Core Sub-architecture
Stratix
Silicon Core Number
EP3S
Silicon Family Name
Stratix III
Kit Contents
Development Board, Cable And Accessories
Rohs Compliant
Yes
For Use With/related Products
EP3SL150F152
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
544-2568

Available stocks

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Manufacturer
Quantity
Price
Part Number:
DK-DEV-3SL150N
Manufacturer:
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Quantity:
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Part Number:
DK-DEV-3SL150N
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Chapter 1: Stratix III Device Datasheet: DC and Switching Characteristics
Electrical Characteristics
Table 1–8. On-Chip Termination Resistance Tolerance Specification for Stratix III Devices
© July 2010 Altera Corporation
R
25- R
25- R
25- R
50- R
50- R
50- R
R
OCT_UNCAL
D
S
S
S
S
S
S
Symbol
3.3, 3.0, 2.5
1.8, 1.5
1.2
3.3, 3.0, 2.5
1.8, 1.5
1.2
The accuracy listed in
temperature changes, the termination resistance value varies.
resistance tolerance for Stratix III OCT.
Table 1–9
calibration. Use
re-calibration.
Equation 1–1. OCT Variation Without Re-Calibration
Notes to
(1) R
(2) R
(3) T is the variation of temperature with respect to the temperature at power-up.
(4) V is the variation of voltage with respect to the V
(5) dR/dT is the percentage change of R
(6) dR/dV is the percentage change of R
Internal series termination without
calibration
Internal series termination without
calibration (25- setting)
Internal series termination without
calibration (25- setting)
Internal series termination without
calibration (25- setting)
Internal series termination without
calibration (50- setting)
Internal series termination without
calibration (50- setting)
Internal series termination without
calibration (50- setting)
Internal differential termination for
LVDS technology (100-setting)
V
CCIO
OCT
SCAL
Equation
.
value calculated from
is the OCT resistance value at power-up.
lists OCT variation with temperature and voltage after power-up
Description
1–1:
Table 1–9
Table 1–7
Equation 1–1
R
O CT
and
=
SCAL
SCAL
Equation 1–1
R
is valid at the time of calibration. If the voltage or
with temperature.
shows the range of OCT resistance with the variation of temperature and
with voltage.
SCAL
V
V
V
V
V
V
V
CCIO
CCIO
CCIO
CCIO
CCIO
CCIO
CCIO
1
= 3.3, 3.0, 2.5 V
= 1.8, 1.5 V
= 1.2 V
= 3.3, 3.0, 2.5 V
= 1.8, 1.5 V
= 1.2 V
= 2.5 V
CCIO
+
Conditions
at power-up.
dR
------ - T
dT
to determine OCT variation without
(Note 1)
dR
------ -
dV
V
Stratix III Device Handbook, Volume 2
±30
±30
±35
±30
±30
±35
Resistance Tolerance
C2
Table 1–8
-15 to 35
±40
±50
±60
±40
±50
±60
C3, I3 C4, I4
lists the
±40
±50
±60
±40
±50
±60
Unit
%
%
%
%
%
%
%
1–7

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