MPC8544COMEDEV Freescale Semiconductor, MPC8544COMEDEV Datasheet - Page 1236

• Manufacturer Part Number: MPC8544COMEDEV
• Description: KIT DEV EXPRESS MPC8544COM
• Manufacturer: Freescale Semiconductor
• Type: MPUr

Specifications of MPC8544COMEDEV

• Contents: Board
• For Use With/related Products: MPC8544
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

1
Debug Features and Watchpoint Facility
21-6
While these signals are normally bidirectional, when sourcing debug information they are output only.
THERM[0:1]
L1_TSTCLK
L2_TSTCLK
TEST_SEL
LSSD_
MODE
Name
TRST
TDO
TMS
TDI
MPC8544E PowerQUICC III Integrated Host Processor Family Reference Manual, Rev. 1
Description
Test select 1
Test mode
Test reset
Test data
Test data
Thermal
resistor
access
output
select
input
Table 21-2. Debug, Watchpoint and Test Signal Summary (continued)
Test
Test
Test
Functional
Debug
Debug
Debug
Debug
Block
Test
Test
Test
Test
Test
Serial input for instructions and data to the JTAG test
subsystem. Internally pulled up.
Serial data output for the JTAG test subsystem. High
impedance except when scanning out data.
Carries commands to the TAP controller for boundary scan
operations. Internally pulled up.
Resets the TAP controller asynchronously.
These pins tie directly to an internal resistor whose value
varies linearly with temperature.
Factory test. Must be negated (pulled high) for normal
operation.
Factory Test. Refer to the MPC8544E Integrated Processor
Hardware Specifications for proper treatment.
Factory Test. Refer to the MPC8544E Integrated Processor
Hardware Specifications for proper treatment.
Factory Test. Refer to the MPC8544E Integrated Processor
Hardware Specifications for proper treatment.
Function
Freescale Semiconductor
Reset
Value
Hi Z
—
—
—
1
1
I/O Page #
O
I
I
I
I
I
I
I
I
21-8
21-8
21-8
21-8
21-8
21-8
21-8
21-8
21-8