MPC564MZP56 Freescale Semiconductor, MPC564MZP56 Datasheet - Page 852

IC MCU 512K FLASH 56MHZ 388-BGA

MPC564MZP56

Manufacturer Part Number
MPC564MZP56
Description
IC MCU 512K FLASH 56MHZ 388-BGA
Manufacturer
Freescale Semiconductor
Series
MPC5xxr
Datasheets

Specifications of MPC564MZP56

Core Processor
PowerPC
Core Size
32-Bit
Speed
56MHz
Connectivity
CAN, EBI/EMI, SCI, SPI, UART/USART
Peripherals
POR, PWM, WDT
Number Of I /o
56
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
2.5 V ~ 2.7 V
Data Converters
A/D 32x10b
Oscillator Type
External
Operating Temperature
-40°C ~ 125°C
Package / Case
388-BGA
Core
PowerPC
Processor Series
MPC5xx
Data Bus Width
32 bit
Maximum Clock Frequency
56 MHz
Data Ram Size
32 KB
On-chip Adc
Yes
Number Of Programmable I/os
56
Number Of Timers
2
Operating Supply Voltage
0 V to 5 V
Mounting Style
SMD/SMT
A/d Bit Size
10 bit
A/d Channels Available
32
Height
1.95 mm
Interface Type
CAN, JTAG, QSPI, SCI, SPI, UART
Length
27 mm
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 40 C
Supply Voltage (max)
2.7 V, 5.25 V
Supply Voltage (min)
2.5 V, 4.75 V
Width
27 mm
For Use With
MPC564EVB - KIT EVAL FOR MPC561/562/563/564
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Lead Free Status / Rohs Status
No RoHS Version Available

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Time Processor Unit 3
19.4.13 SIU Test Register (SIUTST)
19.4.14 Factory Test Registers
Table 19-23
also used by TPU debuggers. They can only be used if the TPU is put into its test mode.
19-22
Bits
1:31
SRESET
SRESET
0
Field TPU_DBG
Addr
Field
TPU_DBG
shows registers that are used for factory test only.The TPU Development Support registers are
Name
Link Register (LR)
Service Grant Latch Register (SGLR)
Decoded Channel Number Register (DCNR)
Internal Scan Data Register (ISDR)
Internal Scan Control Register (ISCR)
TPU3 Test Configuration Register (TCR)
Development Support Control Register (DSCR)
Development Support Status Register (DSSR)
MSB
16
0
This enables the test features of the TPU for use by TPU debuggers. It should only be enabled
while debugging TPU microcode.
0 TPU debugging is disabled
1 TPU debug is enabled
Reserved, always clear to 0.
17
1
Table 19-23. Registers Used for Factory Test Only
18
2
Figure 19-23. SIUTST — SIU Test Register
MPC561/MPC563 Reference Manual, Rev. 1.2
Table 19-22. SIUTST Bit Descriptions
Name
19
3
20
4
21
5
0000_0000_0000_0000
0000_0000_0000_0000
22
6
0x2F_C3FC
23
7
Description
24
8
0x30 402C
0x30 402E
0x30 4022
0x30 4024
0x30 4026
0x30 4002
0x30 4004
0x30 4006
TPU_A
25
9
Address
10
26
11
27
0x30_4404
0x30 442C
0x30 442E
0x30 4422
0x30 4424
0x30 4426
0x30 4402
0x30 4406
TPU_B
12
28
Freescale Semiconductor
13
29
14
30
LSB
15
31

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