MC9S12E128CPVE Freescale Semiconductor, MC9S12E128CPVE Datasheet - Page 508

IC MCU 128K FLASH 25MHZ 112-LQFP

MC9S12E128CPVE

Manufacturer Part Number
MC9S12E128CPVE
Description
IC MCU 128K FLASH 25MHZ 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheets

Specifications of MC9S12E128CPVE

Core Processor
HCS12
Core Size
16-Bit
Speed
25MHz
Connectivity
EBI/EMI, I²C, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
91
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
2.35 V ~ 2.75 V
Data Converters
A/D 16x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
112-LQFP
Processor Series
S12E
Core
HCS12
Data Bus Width
16 bit
Data Ram Size
8 KB
Interface Type
SCI/SPI
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
92
Number Of Timers
12
Operating Supply Voltage
3.135 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWHCS12
Minimum Operating Temperature
- 40 C
On-chip Adc
16-ch x 10-bit
On-chip Dac
2-ch x 8-bit
Controller Family/series
HCS12/S12X
No. Of I/o's
90
Ram Memory Size
8KB
Cpu Speed
25MHz
No. Of Timers
4
Embedded Interface Type
I2C, SCI, SPI
Rohs Compliant
Yes
For Use With
M68EVB912E128 - BOARD EVAL FOR MC9S12E128/64
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

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Chapter 17 Interrupt (INTV1)
17.3.2.2
Read: Only in special modes. Reads will return either the state of the interrupt inputs of the interrupt
sub-block (WRTINT = 0) or the values written into the TEST registers (WRTINT = 1). Reads will always
return 0s in normal modes.
Write: Only in special modes and with WRTINT = 1 and CCR I mask = 1.
508
ADR[3:0]
WRTINT
INT[E:0]
Reset
Field
Field
3:0
7:0
4
W
R
INTE
Write to the Interrupt Test Registers
Read: anytime
Write: only in special modes and with I-bit mask and X-bit mask set.
0 Disables writes to the test registers; reads of the test registers will return the state of the interrupt inputs.
1 Disconnect the interrupt inputs from the priority decoder and use the values written into the ITEST registers
Note: Any interrupts which are pending at the time that WRTINT is set will remain until they are overwritten.
Test Register Select Bits
Read: anytime
Write: anytime
These bits determine which test register is selected on a read or write. The hexadecimal value written here will
be the same as the upper nibble of the lower byte of the vector selects. That is, an “F” written into ADR[3:0] will
select vectors 0xFFFE–0xFFF0 while a “7” written to ADR[3:0] will select vectors 0xFF7E–0xFF70.
Interrupt TEST Bits — These registers are used in special modes for testing the interrupt logic and priority
independent of the system configuration. Each bit is used to force a specific interrupt vector by writing it to a
logic 1 state. Bits are named INTE through INT0 to indicate vectors 0xFFxE through 0xFFx0. These bits can be
written only in special modes and only with the WRTINT bit set (logic 1) in the interrupt test control register
(ITCR). In addition, I interrupts must be masked using the I bit in the CCR. In this state, the interrupt input lines
to the interrupt sub-block will be disconnected and interrupt requests will be generated only by this register.
These bits can also be read in special modes to view that an interrupt requested by a system block (such as a
peripheral block) has reached the INT module.
There is a test register implemented for every eight interrupts in the overall system. All of the test registers share
the same address and are individually selected using the value stored in the ADR[3:0] bits of the interrupt test
control register (ITCR).
Note: When ADR[3:0] have the value of 0x000F, only bits 2:0 in the ITEST register will be accessible. That is,
Interrupt Test Registers
0
7
instead.
vectors higher than 0xFFF4 cannot be tested using the test registers and bits 7:3 will always read as a
logic 0. If ADR[3:0] point to an unimplemented test register, writes will have no effect and reads will always
return a logic 0 value.
= Unimplemented or Reserved
INTC
0
6
Figure 17-3. Interrupt TEST Registers (ITEST)
Table 17-3. ITEST Field Descriptions
Table 17-2. ITCR Field Descriptions
INTA
MC9S12E128 Data Sheet, Rev. 1.07
0
5
INT8
0
4
Description
Description
INT6
0
3
INT4
0
2
Freescale Semiconductor
INT2
0
1
INT0
0
0

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