PEF 20525 F V1.3 Infineon Technologies, PEF 20525 F V1.3 Datasheet - Page 246

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PEF 20525 F V1.3

Manufacturer Part Number
PEF 20525 F V1.3
Description
IC CTRL PPP/HDLC SERIAL TQFP-100
Manufacturer
Infineon Technologies
Datasheet

Specifications of PEF 20525 F V1.3

Function
Serial Optimized Communications Controller
Interface
ASYNC, BISYNC, HDLC, PPP
Number Of Circuits
2
Voltage - Supply
3 V ~ 3.6 V
Current - Supply
50mA
Power (watts)
150mW
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
100-LFQFP
Includes
Bit Processor Functions, Serial Communication Controllers (SCCs)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
PEF20525FV1.3X
PEF20525FV13XP
SP000007592
8
8.1
In the SEROCCO-H a Test Access Port (TAP) controller is implemented. The essential
part of the TAP is a finite state machine (16 states) controlling the different operational
modes of the boundary scan. Both, TAP controller and boundary scan, meet the
requirements given by the JTAG standard: IEEE 1149.1.
about the TAP controller.
Figure 80
If no boundary scan operation is planned TRST has to be connected with V
and TDI do not need to be connected since pull-up transistors ensure high input levels
in this case. Nevertheless it would be a good practice to put these unused inputs to
defined levels, using pull-up resistors.
Test handling (boundary scan operation) is performed via the pins TCK (Test Clock),
TMS (Test Mode Select), TDI (Test Data Input) and TDO (Test Data Output) when the
TAP controller is not in its reset state, i.e. TRST is connected to V
unconnected due to its internal pull-up. Test data at TDI are loaded with a 4-MHz clock
Data Sheet
TCK
TRST
TMS
TDI
TDO
Test Modes
JTAG Boundary Scan Interface
Block Diagram of Test Access Port and Boundary Scan Unit
CLOCK
Reset
Test
Control
Data in
Enable
Data out
Test Access Port (TAP)
- Finite State Machine
- Instruction Register (3 bit)
- Test Signal Generator
Clock Generation
TAP Controller
CLOCK
246
Figure 80
ID Data out
Control
Bus
SS Data
out
6
gives an overview
DD
SS
or it remains
PEB 20525
2
1
n
PEF 20525
Test Modes
. TMS, TCK
Pins
.
.
.
.
.
.
2000-09-14

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