DK-DEV-5M570ZN Altera, DK-DEV-5M570ZN Datasheet - Page 148

• Manufacturer Part Number: DK-DEV-5M570ZN
• Description: KIT DEV MAX V 5M570Z
• Manufacturer: Altera
• Series: MAX® Vr
• Type: CPLDr

Specifications of DK-DEV-5M570ZN

• Contents: Board, Cable(s), Software and Documentation
• Silicon Manufacturer: Altera
• Core Architecture: CPLD
• Core Sub-architecture: MAX
• Silicon Core Number: 5M
• Silicon Family Name: MAX V
• Kit Contents: MAX V CPLD Development Board, USB Cable
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With/related Products: 5M570ZF256
• Lead Free Status / Rohs Status: Compliant
• Other names: 544-2722

8–2
IEEE Std. 1149.1 BST Architecture
MAX V Device Handbook
■
■
■
In addition to BST, you can use the IEEE Std. 1149.1 controller for in-system
programming for MAX V devices. MAX V devices support IEEE 1532 programming,
which uses the IEEE Std. 1149.1 test access port (TAP) interface. However, this chapter
only describes the BST feature of the IEEE Std. 1149.1 circuitry.
A MAX V device operating in IEEE Std. 1149.1 BST mode uses four required pins, TDI,
TDO, TMS, and TCK.
Table 8–1
pin.
Table 8–1. IEEE Std. 1149.1 Pin Descriptions
The IEEE Std. 1149.1 BST circuitry requires the following registers:
■
■
■
TDI
TDO
TMS
TCK
Notes to
(1) The TDI and TMS pins have internal weak pull-up resistors
(2) The TCK pin has an internal weak pull-down resistor
Pin
“Disabling IEEE Std. 1149.1 BST Circuitry” on page 8–15
“Guidelines for IEEE Std. 1149.1 Boundary-Scan Testing” on page 8–15
“Boundary-Scan Description Language Support” on page 8–15
The instruction register determines which action to perform and which data
register to access.
The bypass register (which is a 1-bit long data register) provides a
minimum-length serial path between the TDI and TDO pins.
The boundary-scan register that is a shift register composed of all the BSCs of the
device.
(1)
(2)
(1)
Table
lists the functions of each of these pins. MAX V devices do not have a TRST
Test mode select
8–1:
Test data output
Test clock input
Test data input
Description
Serial input pin for instructions as well as test and
programming data. Data is shifted in on the rising edge of TCK.
Serial data output pin for instructions as well as test and
programming data. Data is shifted out on the falling edge of
TCK. The pin is tri-stated if data is not being shifted out of the
device.
Input pin that provides the control signal to determine the
transitions of the TAP controller state machine. Transitions
within the state machine occur at the rising edge of TCK.
Therefore, you must set up the TMS before the rising edge of
TCK. TMS is evaluated on the rising edge of TCK.
The clock input to the BST circuitry. Some operations occur at
the rising edge, while others occur at the falling edge.
Chapter 8: JTAG Boundary-Scan Testing in MAX V Devices
Function
December 2010 Altera Corporation
IEEE Std. 1149.1 BST Architecture