DK-DEV-5M570ZN Altera, DK-DEV-5M570ZN Datasheet - Page 150

KIT DEV MAX V 5M570Z

DK-DEV-5M570ZN

Manufacturer Part Number
DK-DEV-5M570ZN
Description
KIT DEV MAX V 5M570Z
Manufacturer
Altera
Series
MAX® Vr
Type
CPLDr

Specifications of DK-DEV-5M570ZN

Contents
Board, Cable(s), Software and Documentation
Silicon Manufacturer
Altera
Core Architecture
CPLD
Core Sub-architecture
MAX
Silicon Core Number
5M
Silicon Family Name
MAX V
Kit Contents
MAX V CPLD Development Board, USB Cable
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With/related Products
5M570ZF256
Lead Free Status / Rohs Status
Compliant
Other names
544-2722

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Part Number:
DK-DEV-5M570ZN
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ALTERA
0
8–4
MAX V Device Handbook
Boundary-Scan Cells of a MAX V Device I/O Pin
Figure 8–3
Std. 1149.1 device.
Figure 8–3. Boundary-Scan Register
Except for the four JTAG pins and power pins, you can use all the pins of a MAX V
device (including clock pins) as user I/O pins and have a BSC. The 3-bit BSC consists
of a set of capture registers and a set of update registers. The capture registers can
connect to internal device data through the OUTJ and OEJ signals, while the update
registers connect to external data through the PIN_OUT and PIN_OE signals. The TAP
controller internally generates the SHIFT, CLOCK, and UPDATE global control signals for
the IEEE Std. 1149.1 BST registers; a decode of the instruction register generates the
MODE signal. The data signal path for the boundary-scan register runs from the serial
data in (SDI) signal to the serial data out (SDO) signal. The scan register begins at the
TDI pin and ends at the TDO pin of the device.
shows how test data is serially shifted around the periphery of the IEEE
TDI
TMS
TAP Controller
Internal Logic
TCK
Chapter 8: JTAG Boundary-Scan Testing in MAX V Devices
TDO
IEEE Std. 1149.1 Boundary-Scan Register
Each peripheral
element is either an
I/O pin, dedicated
input pin, or
dedicated
configuration pin.
December 2010 Altera Corporation

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