DK-DEV-5M570ZN Altera, DK-DEV-5M570ZN Datasheet - Page 98

KIT DEV MAX V 5M570Z

DK-DEV-5M570ZN

Manufacturer Part Number
DK-DEV-5M570ZN
Description
KIT DEV MAX V 5M570Z
Manufacturer
Altera
Series
MAX® Vr
Type
CPLDr

Specifications of DK-DEV-5M570ZN

Contents
Board, Cable(s), Software and Documentation
Silicon Manufacturer
Altera
Core Architecture
CPLD
Core Sub-architecture
MAX
Silicon Core Number
5M
Silicon Family Name
MAX V
Kit Contents
MAX V CPLD Development Board, USB Cable
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With/related Products
5M570ZF256
Lead Free Status / Rohs Status
Compliant
Other names
544-2722

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0
6–4
MAX V Device Handbook
JTAG Block
f
f
For more information about JTAG BST, refer to the
MAX V Devices
If you issue either the USER0 or USER1 instruction to the JTAG test access port (TAP)
controller, the MAX V JTAG block feature allows you to access the JTAG TAP
controller and state signals. The USER0 and USER1 instructions bring the JTAG
boundary-scan chain (TDI) through the user logic instead of the boundary-scan cells
(BSCs) of MAX V devices. Each USER instruction allows for one unique user-defined
JTAG chain into the logic array.
Parallel Flash Loader
MAX V devices have the ability to interface JTAG to non-JTAG devices and are
suitable to use with the general flash memory devices that require programming
during the in-circuit test. You can use the flash memory devices for FPGA
configuration or be part of the system memory. In many cases, you can use the
MAX V device as a bridge device that controls configuration between FPGA and flash
devices. Unlike ISP-capable CPLDs, bulk flash devices do not have JTAG TAP pins or
connections. For small flash devices, it is common to use the serial JTAG scan chain of
a connected device to program the non-JTAG flash device but this is slow, inefficient,
and impractical for large parallel flash devices. Using the MAX V JTAG block as a
parallel flash loader (PFL) with the Quartus II software to program and verify flash
contents provides a fast and cost-effective means of in-circuit programming during
testing.
For more information about PFL, refer to the
Guide.
chapter.
Chapter 6: JTAG and In-System Programmability in MAX V Devices
Parallel Flash Loader Megafunction User
JTAG Boundary-Scan Testing for
IEEE Std. 1149.1 Boundary-Scan Support
December 2010 Altera Corporation

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