EP3C16F256I7N Altera, EP3C16F256I7N Datasheet - Page 397

• Manufacturer Part Number: EP3C16F256I7N
• Description: Cyclone III
• Manufacturer: Altera

Boundary-Scan
Description
Language
(BSDL) Support
Conclusion
References
Document
Revision History
Altera Corporation-Preliminary
March 2007
March 2007 v1.0
Table 14–7. Document Revision History
Document
Date and
Version
f
Initial Release
BSDL, a subset of VHDL, provides a syntax that allows you to describe
the features of an IEEE Std. 1149.1 BST-capable device that can be tested.
Test software development systems then use the BSDL files for test
generation, analysis, and failure diagnostics.
For more information on BSDL files for IEEE Std. 1149.1-compliant
Cyclone III devices and the BSDLCustomizer script, visit the Altera web
site at www.altera.com.
The IEEE Std. 1149.1 BST circuitry available in Cyclone III devices
provides a cost-effective and efficient way to test systems that contain
devices with tight lead spacing. Circuit boards with Altera and other IEEE
Std. 1149.1-compliant devices can use the EXTEST, SAMPLE/PRELOAD,
and BYPASS modes to create serial patterns that internally test the pin
connections between devices and check device operation.
Bleeker, H., P. van den Eijnden, and F. de Jong. Boundary-Scan Test: A
Practical Approach. Eindhoven, The Netherlands: Kluwer Academic
Publishers, 1993.
Institute of Electrical and Electronics Engineers, Inc. IEEE Standard Test
Access Port and Boundary-Scan Architecture (IEEE Std 1149.1-2001). New
York: Institute of Electrical and Electronics Engineers, Inc., 2001.
Maunder, C. M., and R. E. Tulloss. The Test Access Port and Boundary-Scan
Architecture. Los Alamitos: IEEE Computer Society Press, 1990.
Table 14–7
shows the revision history for this document.
Changes Made
Boundary-Scan Description Language (BSDL) Support
Cyclone III Device Handbook, Volume 1
Summary of Changes
14–23