RCLXT16706FE Intel, RCLXT16706FE Datasheet - Page 347
RCLXT16706FE
Manufacturer Part Number
RCLXT16706FE
Description
Manufacturer
Intel
Datasheet
1.RCLXT16706FE.pdf
(352 pages)
Specifications of RCLXT16706FE
Operating Supply Voltage (typ)
3.3V
Operating Supply Voltage (min)
2.97V
Operating Supply Voltage (max)
3.63V
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Lead Free Status / Rohs Status
Not Compliant
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Figure 98. JTAG Test Circuitry
Figure 99. TAP State Machine
The TAP controller is a state machine that controls the function of the boundary scan circuitry.
Inputs to the TAP controller are the Test Mode Select (JTMS) and the Test Clock (JTCK) signals.
Figure 99
1
0
JTMS
JTCK
JTRS
JTDI
Test-Logic-Reset
shows the state machine as defined by the 1149.1 Specification.
Run-Test/Idle
51/155/622/2488 Mbit/s SONET/SDH Cell/Packet Interface — Intel IXF6048
0
MSB
Test Access
Port (TAP)
Controller
Boundary Scan Register
Device ID Register
Instruction Register
Bypass Register
1
0
0
1
1
Select-DR-Scan
Capture -DR
Update-DR
Pause-DR
Exit1-DR
Exit2-DR
Shift-DR
0
0
1
0
1
1
0
LSB
1
1
0
1
0
1
Select-IR-Scan
Capture -IR
Update-IR
Pause-IR
Exit1-IR
Exit2-IR
Shift-IR
0
0
1
0
1
1
JTDO
0
1
1
0
0
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