AMD-K6-IIIE+550ACR AMD (ADVANCED MICRO DEVICES), AMD-K6-IIIE+550ACR Datasheet - Page 155

• Manufacturer Part Number: AMD-K6-IIIE+550ACR
• Manufacturer: AMD (ADVANCED MICRO DEVICES)

Specifications of AMD-K6-IIIE+550ACR

• Lead Free Status / RoHS Status: Not Compliant

23543A/0—September 2000
5.46
Pin Attribute
Summary
Sampled
5.47
Pin Attribute
Summary
Sampled
5.48
Pin Attribute
Summary
Driven and Floated
Chapter 5
TDI (Test Data Input)
TCK (Test Clock)
TDO (Test Data Output)
Input, Internal Pullup
TCK is the clock for boundary-scan testing using the Test
Access Port (TAP). See “Boundary-Scan Test Access Port
(TAP)” on page 253 for details regarding the operation of the
TAP controller.
The processor always samples TCK, except while TRST# is
asserted.
Input, Internal Pullup
T D I i s t h e s e r i a l t e s t d a t a a n d i n s t r u c t i o n i n p u t fo r
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 253 for
details regarding the operation of the TAP controller.
The processor samples TDI on every rising TCK edge, but only
while in the Shift-IR and Shift-DR states.
Output
TDO is the serial test data and instruction out put for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 253 for
details regarding the operation of the TAP controller.
The processor drives TDO on every falling TCK edge, but only
while in the Shift-IR and Shift-DR states. TDO is floated at all
other times.
Signal Descriptions
AMD-K6™-IIIE+ Embedded Processor Data Sheet
133