AMD-K6-IIIE+550ACR AMD (ADVANCED MICRO DEVICES), AMD-K6-IIIE+550ACR Datasheet - Page 156

• Manufacturer Part Number: AMD-K6-IIIE+550ACR
• Manufacturer: AMD (ADVANCED MICRO DEVICES)

Specifications of AMD-K6-IIIE+550ACR

• Lead Free Status / RoHS Status: Not Compliant

AMD-K6™-IIIE+ Embedded Processor Data Sheet
5.49
Pin Attribute
Summary
Sampled
5.50
Pin Attribute
Summary
Sampled
134
TMS (Test Mode Select)
TRST# (Test Reset)
Input, Internal Pullup
TMS specifies the test function and sequence of state changes
for boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 253 for
details regarding the operation of the TAP controller.
The processor samples TMS on every rising TCK edge. If TMS is
sampled High for five or more consecutive clocks, the TAP
controller enters its Test-Logic-Reset state, regardless of the
controller state. This action is the same as that achieved by
asserting TRST#.
Input, Internal Pullup
The assertion of TRST# initializes the Test Access Port (TAP) by
resetting its state machine to the Test-Logic-Reset state. See
“Boundary-Scan Test Access Port (TAP)” on page 253 for
details regarding the operation of the TAP controller.
TRST# is a completely asynchronous input that does not
require a minimum setup and hold time relative to TCK. See
Ta b l e 7 0 o n p a g e 3 1 0 f o r t h e m i n i m u m p u l s e w i d t h
requirement.
Preliminary Information
Signal Descriptions
23543A/0—September 2000
Chapter 5