MC9S12E128CPV Freescale Semiconductor, MC9S12E128CPV Datasheet - Page 566
MC9S12E128CPV
Manufacturer Part Number
MC9S12E128CPV
Description
Microcontrollers (MCU) 16 Bit 16MHz
Manufacturer
Freescale Semiconductor
Datasheet
1.MC9S12E128CPV.pdf
(606 pages)
Specifications of MC9S12E128CPV
Data Bus Width
16 bit
Program Memory Type
Flash
Program Memory Size
128 KB
Data Ram Size
8 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
92
Number Of Timers
16 bit
Operating Supply Voltage
3.135 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
LQFP-112
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit
On-chip Dac
8 bit, 2 Channel
Lead Free Status / Rohs Status
No RoHS Version Available
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MC9S12E128CPVE
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
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Appendix A Electrical Characteristics
A.1.6
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
566
Human Body
Machine
Latch-up
Num
1
2
3
4
5
Model
C
C
C
C
C
C
ESD Protection and Latch-up Immunity
Series Resistance
Storage Capacitance
Number of Pulse per pin
Series Resistance
Storage Capacitance
Number of Pulse per pin
Minimum input voltage limit
Maximum input voltage limit
Human Body Model (HBM)
Machine Model (MM)
Charge Device Model (CDM)
Latch-up Current at 125 C
Latch-up Current at 27 C
positive
negative
positive
negative
positive
negative
positive
negative
Table A-3. ESD and Latch-Up Protection Characteristics
Table A-2. ESD and Latch-up Test Conditions
MC9S12E128 Data Sheet, Rev. 1.07
Rating
Description
Symbol
V
V
V
I
I
HBM
CDM
LAT
LAT
MM
Symbol
R1
R1
—
—
—
—
—
—
C
C
2000
+100
+200
-100
-200
Min
200
500
Freescale Semiconductor
Value
1500
–2.5
100
200
7.5
–
3
3
0
3
3
Max
—
—
—
—
—
—
—
Ohm
Ohm
Unit
Unit
pF
pF
mA
mA
V
V
V
V
V
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