MC9S12E128CPV Freescale Semiconductor, MC9S12E128CPV Datasheet - Page 583

Microcontrollers (MCU) 16 Bit 16MHz

MC9S12E128CPV

Manufacturer Part Number
MC9S12E128CPV
Description
Microcontrollers (MCU) 16 Bit 16MHz
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MC9S12E128CPV

Data Bus Width
16 bit
Program Memory Type
Flash
Program Memory Size
128 KB
Data Ram Size
8 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
92
Number Of Timers
16 bit
Operating Supply Voltage
3.135 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
LQFP-112
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit
On-chip Dac
8 bit, 2 Channel
Lead Free Status / Rohs Status
No RoHS Version Available

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MC9S12E128CPVE
Manufacturer:
FREESCALE
Quantity:
1 560
Part Number:
MC9S12E128CPVE
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Part Number:
MC9S12E128CPVE
Manufacturer:
FREESCALE
Quantity:
1 560
A.4.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
1
2
3
Freescale Semiconductor
Conditions are shown in
Num C
T
application.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to
25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please refer
to Engineering Bulletin EB618.
Spec table quotes typical endurance evaluated at 25 C for this product family, typical endurance at various temperature can
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer to
Engineering Bulletin EB619.
1
2
3
4
Javg
will not exeed 85 C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention after 10,000 program/erase cycles at an
C Data retention with <100 program/erase cycles at an
C Number of program/erase cycles
C Number of program/erase cycles
average junction temperature of T
average junction temperature T
(–40 C
(0 C
NVM Reliability
T
J
T
J
140 C)
Table A-4
0 C)
unless otherwise noted
Rating
Table A-15. NVM Reliability Characteristics
Javg
MC9S12E128 Data Sheet, Rev. 1.07
Javg
Flash Reliability Characteristics
85 C
85 C
Symbol
t
FLRET
n
FL
10,000
10,000
Min
15
20
1
Appendix A Electrical Characteristics
100,000
100
100
Typ
2
2
3
Max
Cycles
Years
Unit
583

Related parts for MC9S12E128CPV