MMC2114CFCAG33 Freescale Semiconductor, MMC2114CFCAG33 Datasheet - Page 623

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MMC2114CFCAG33

Manufacturer Part Number
MMC2114CFCAG33
Description
IC MCU 32BIT 33MHZ 144-LQFP
Manufacturer
Freescale Semiconductor
Series
MCorer
Datasheets

Specifications of MMC2114CFCAG33

Core Processor
M210
Core Size
32-Bit
Speed
33MHz
Connectivity
EBI/EMI, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
67
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LQFP
Processor Series
MMC2114
Core
M-CORE
Data Bus Width
32 bit
Data Ram Size
32 KB
Interface Type
SCI/SPI
Maximum Clock Frequency
33 MHz
Number Of Programmable I/os
104
Number Of Timers
2
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
Controller Family/series
MCORE
No. Of I/o's
104
Ram Memory Size
32KB
Cpu Speed
33MHz
No. Of Timers
2
Embedded Interface Type
SCI, SPI
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

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MMC2114 • MMC2113 • MMC2112 — Rev. 1.0
MOTOROLA
10. Condition applies to two adjacent pins.
11. Current coupling ratio, K, is defined as the ratio of the output current, I
12. Performance expected with production silicon.
13. Maximum source impedance is application-dependent. Error resulting from pin leakage depends on junction leakage into
14. For a maximum sampling error of the input voltage <= 1 LSB, then the external filter capacitor, C
7. Below disruptive current conditions, the channel being stressed has conversion values of $3FF for analog inputs greater
8. Exceeding limit may cause conversion error on stressed channels and on unstressed channels. Transitions within the limit
9. Input must be current limited to the value specified. To determine the value of the required current-limiting resister, calculate
than V
sample amplifier. Other channels are not affected by non-disruptive conditions.
do not affect device reliability or cause permanent damage.
resistance values using V
current, I
error on the channel under test is calculated as V
the pin and on leakage due to charge-sharing with internal capacitance.
Error from junction leakage is a function of external source impedance and input leakage current. In this expression,
expected error in result value due to junction leakage is expressed in voltage (V
where I
Charge-sharing leakage is a function of input source impedance, conversion rate, change in voltage between successive
conversions, and the size of the filtering capacitor used. Error levels are best determined empirically. In general, continuous
conversion of the same channel may not be compatible with high source impedance.
value of C
RH
OFF
inj
and $000 for values less than V
samp
, when both adjacent pins are overstressed with the specified injection current. K = I
is a function of operating temperature.
in the new design may be reduced.
POSCLAMP
Freescale Semiconductor, Inc.
For More Information On This Product,
= V
Preliminary Electrical Specifications
DDA
RL
Go to: www.freescale.com
. This assumes that V
+ 0.5V and V
err
= I
V
errj
inj
= R
NEGCLAMP
* K * R
S
* I
S
OFF
.
RH
= – 0.3 V, then use the larger of the calculated values.
< V
Out
DDA
, measured on the pin under test to the injection
and V
errj
Preliminary Electrical Specifications
):
RL
QADC Electrical Characteristics
> V
SSA
due to the presence of the
Out
f
/ I
>= 1024 * C
Advance Information
inj
The input voltage
samp
. The
623

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