AT91SAM9G45-EKES Atmel, AT91SAM9G45-EKES Datasheet - Page 56

• Manufacturer Part Number: AT91SAM9G45-EKES
• Description: KIT EVAL FOR AT91SAM9G45
• Manufacturer: Atmel
• Series: AT91SAM Smart ARMr
• Type: MCUr

Specifications of AT91SAM9G45-EKES

• Contents: Board
• Processor To Be Evaluated: SAM9G45
• Data Bus Width: 32 bit
• Interface Type: I2C, SPI, UART
• Maximum Operating Temperature: + 50 C
• Minimum Operating Temperature: - 10 C
• Operating Supply Voltage: 1.8 V to 3.3 V
• For Use With/related Products: AT91SAM9G45
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: Q4626953

10.6.4
10.6.5
10.6.6
Access:
• VERSION[31:28]: Product Version Number
Set to 0x0.
• PART NUMBER[27:12]: Product Part Number
Product part Number is 5B27
• MANUFACTURER IDENTITY[11:1]
Set to 0x01F.
Bit[0] required by IEEE Std. 1149.1.
Set to 0x1.
JTAG ID Code value is 05B2_703F.
56
31
23
15
7
AT91SAM9G45
Read-only
Debug Unit
IEEE 1149.1 JTAG Boundary Scan
JID Code Register
30
22
14
6
PART NUMBER
VERSION
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two peripheral data controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel.The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The AT91SAM9G45 Debug Unit Chip ID value is 0x819B 05A2 and the extended ID is
0x00000004 on 32-bit width.
For further details on the Debug Unit, see the Debug Unit section.
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging
technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST
and BYPASS functions are implemented. In ICE debug mode, the ARM processor responds
with a non-JTAG chip ID that identifies the processor to the ICE system. This is not IEEE 1149.1
JTAG-compliant.
It is not possible to switch directly between JTAG and ICE operations. A chip reset must be per-
formed after JTAGSEL is changed.
A Boundary-scan Descriptor Language (BSDL) file is provided to set up test.
29
21
13
5
MANUFACTURER IDENTITY
28
20
12
4
PART NUMBER
27
19
11
3
MANUFACTURER IDENTITY
26
18
10
2
PART NUMBER
25
17
9
1
6438F–ATARM–21-Jun-10
24
16
8
0
1