AT91SAM9G45-CU Atmel, AT91SAM9G45-CU Datasheet - Page 51

• Manufacturer Part Number: AT91SAM9G45-CU
• Description: MCU ARM9 324-TFBGA
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM9G45-CU

• Core Processor: ARM9
• Core Size: 16/32-Bit
• Speed: 400MHz
• Connectivity: EBI/EMI, Ethernet, I²C, IrDA, MMC, SPI, SSC, UART/USART, USB
• Peripherals: AC'97, DMA, I²S, LCD, POR, PWM, WDT
• Number Of I /o: 160
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: ROM
• Ram Size: 128K x 8
• Voltage - Supply (vcc/vdd): 0.9 V ~ 1.1 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 324-TFBGA
• Processor Series: AT91SAMx
• Core: ARM926EJ-S
• Data Bus Width: 32 bit
• Data Ram Size: 64 KB
• Interface Type: I2C, SPI, UART
• Maximum Clock Frequency: 800 MHz
• Number Of Programmable I/os: 160
• Number Of Timers: 5
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: AT91SAM-ICE, AT91-ISP
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit
• Controller Family/series: AT91
• No. Of I/o's: 160
• Ram Memory Size: 64KB
• Cpu Speed: 400MHz
• No. Of Timers: 2
• Rohs Compliant: Yes
• For Use With: AT91SAM9G45-EKES - KIT EVAL FOR AT91SAM9G45
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

10. AT91SAM9G45 Debug and Test
10.1
10.2
6438F–ATARM–21-Jun-10
Description
Embedded Characteristics
The AT91SAM9G45 features a number of complementary debug and test capabilities. A com-
mon JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. The Debug Unit provides a two-pin
UART that can be used to upload an application into internal SRAM. It manages the interrupt
handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
• ARM926 Real-time In-circuit Emulator
• Debug Unit
• IEEE1149.1 JTAG Boundary-scan on All Digital Pins.
– Two real-time Watchpoint Units
– Two Independent Registers: Debug Control Register and Debug Status Register
– Test Access Port Accessible through JTAG Protocol
– Debug Communications Channel
– Two-pin UART
– Debug Communication Channel Interrupt Handling
– Chip ID Register
AT91SAM9G45
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