MCF5307CFT66B Freescale Semiconductor, MCF5307CFT66B Datasheet - Page 386

• Manufacturer Part Number: MCF5307CFT66B
• Description: IC MPU 32BIT 66MHZ COLDF 208FQFP
• Manufacturer: Freescale Semiconductor
• Series: MCF530xr

Specifications of MCF5307CFT66B

• Core Processor: Coldfire V3
• Core Size: 32-Bit
• Speed: 66MHz
• Connectivity: EBI/EMI, I²C, UART/USART
• Peripherals: DMA, POR, WDT
• Number Of I /o: 16
• Program Memory Type: ROMless
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 208-FQFP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -
• Program Memory Size: -
• Data Converters: -

Freescale Semiconductor, Inc.
Debug Module/JTAG Signals
controller in test logic reset state immediately. Tying it to V
causes the JTAG controller
DD
(if TMS is a logic level of 1) to eventually enter test logic reset state after 5 TCK clocks.
If MTMOD0 is low, DSCLK is selected. DSCLK is the development serial clock for the
serial interface to the debug module. The maximum DSCLK frequency is 1/5 CLKIN. See
Chapter 5, “Debug Support.”
17.14.2 Test Mode Select/Breakpoint (TMS/BKPT)
If MTMOD0 is high, TMS is selected. The TMS input provides information to determine
the JTAG test operation mode. The state of TMS and the internal 16-state JTAG controller
state machine at the rising edge of TCK determine whether the JTAG controller holds its
current state or advances to the next state. This directly controls whether JTAG data or
instruction operations occur. TMS has an internal pull-up resistor so that if it is not driven
low, it defaults to a logic level of 1. But if TMS is not used, it should be tied to V
.
DD
If MTMOD0 is low, BKPT is selected. BKPT signals a hardware breakpoint to the
processor in debug mode. See Chapter 5, “Debug Support.”
17.14.3 Test Data Input/Development Serial Input (TDI/DSI)
If MTMOD0 is high, TDI is selected. TDI provides the serial data port for loading the
various JTAG boundary scan, bypass, and instruction registers. Shifting in data depends on
the state of the JTAG controller state machine and the instruction in the instruction register.
Shifts occur on the TCK rising edge. TDI has an internal pull-up resistor, so when not
driven low it defaults to high. But if TDI is not used, it should be tied to V
.
DD
If MTMOD0 is low, DSI is selected. DSI provides the single-bit communication for debug
module commands. See Chapter 5, “Debug Support.”
17.14.4 Test Data Output/Development Serial Output
(TDO/DSO)
If MTMOD0 is high, TDO is selected. The TDO output provides the serial data port for
outputting data from JTAG logic. Shifting out data depends on the JTAG controller state
machine and the instruction in the instruction register. Data shifting occurs on the falling
edge of TCK. When TDO is not outputting test data, it is three-stated. TDO can be
three-stated to allow bused or parallel connections to other devices having JTAG.
If MTMOD0 is low, DSO is selected. DSO provides single-bit communication for debug
module responses. See Chapter 5, “Debug Support.”
17-22
MCF5307 User’s Manual
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