DF2211NP24V Renesas Technology / Hitachi Semiconductor, DF2211NP24V Datasheet - Page 503

• Manufacturer Part Number: DF2211NP24V
• Description: H8S/2200 Series, 2212 Group, USB, RTC, HSS TNP-64B; Vcc= 2.7 to 3.6 volts, Temp= -20 to 75 C; Package: PVQN0064LB-A
• Manufacturer: Renesas Technology / Hitachi Semiconductor

The HD64F2218, HD64F2218U, HD64F2218CU and HD64F2217CU incorporate a boundary
scan function, which is a serial I/O interface based on the JTAG (Joint Test Action Group,
IEEEStd.1149.1 and IEEE Standard Test Access Port and Boundary Scan Architecture). Figure
13.1 shows the block diagram of the boundary scan function.
13.1
• Five test signals
• Six test modes supported
• Boundary scan function cannot be performed on the following pins.
⎯ TCK, TDI, TDO, TMS, TRST
⎯ BYAPASS, SAMPLE/PRELOAD, EXTEST, CLAMP, HIGHZ, IDCODE
⎯ Power supply pins: VCC, VSS, Vref, PLLVCC, PLLVSS, DrVCC, DrVSS
⎯ Clock signals:
⎯ Analog signals:
⎯ Boundary scan signals: TCK, TDI, TDO, TMS, TRST
⎯ H-UDI control signal: EMLE
Features
Section 13 Boundary Scan Function
EXTAL, XTAL, OSC2, OSC1
P40 to P43, P96, P97, USD+, USD-
Rev.7.00 Dec. 24, 2008 Page 449 of 698
REJ09B0074-0700