MK30DN512ZVLK10 Freescale Semiconductor, MK30DN512ZVLK10 Datasheet - Page 1474

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MK30DN512ZVLK10

Manufacturer Part Number
MK30DN512ZVLK10
Description
ARM Microcontrollers - MCU KINETIS 512K SLCD
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MK30DN512ZVLK10

Core
ARM Cortex M4
Processor Series
K30
Data Bus Width
32 bit
Maximum Clock Frequency
50 MHz
Program Memory Size
512 KB
Data Ram Size
128 KB
On-chip Adc
Yes
Operating Supply Voltage
1.71 V to 3.6 V
Operating Temperature Range
- 40 C to + 105 C
Package / Case
LQFP-80
Mounting Style
SMD/SMT

Available stocks

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Part Number
Manufacturer
Quantity
Price
Part Number:
MK30DN512ZVLK10
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Memory map and register definition
49.3.4 LCD fault detect status register (LCD_FDSR)
The reset value of this register depends on the reset type:POR -- 0x0000_0000
Address: LCD_FDSR is 400B_E000h base + Ch offset = 400B_E00Ch
1474
Reset
Reset
Bit
Bit
Reserved
W
W
FDBPEN
FDPINID
R
R
FDEN
Field
5–0
8
7
6
FDCF
w1c
31
15
0
0
30
14
0
0
4
5
6
7
Reserved
This read-only field is reserved and always has the value zero.
Fault detect enable
If LCDEN is 1, asserting FDEN inserts a test frame after normal LCD refresh frame is completed. After the
test frame is done, Fault detection complete flag (FDCF) is set. When the test frame is done, a normal
LCD refresh frame starts. FDEN is one-shot register, it clears after FDCF is set.
To initiate another fault detection, FDEN must be set again.
0
1
Fault detect backplane enable
Enable "backplane" timing for the fault detect circuit. FDBPEN = 0 generates frontplane timing. This bit
specifies the type of pin selected under fault detect test.
0
1
Fault detect pin ID
Specifies the LCD pin to be checked by pull-up fault detection.
0
1
...
63
Sample window width is 64 sample clock cycles.
Sample window width is 128 sample clock cycles.
Sample window width is 256 sample clock cycles.
Sample window width is 512 sample clock cycles.
Disable fault detection.
Enable fault detection.
Type of the selected pin under fault detect test is frontplane.
Type of the selected pin under fault detect test is backplane.
Fault detection for LCD_P0 pin.
Fault detection for LCD_P1 pin.
Fault detection for LCD_P63 pin.
29
13
0
0
K30 Sub-Family Reference Manual, Rev. 6, Nov 2011
28
12
0
0
LCD_FDCR field descriptions (continued)
27
11
0
0
0
26
10
0
0
25
0
0
9
24
0
0
8
0
Description
23
0
0
7
22
0
0
6
21
0
0
5
20
0
0
4
FDCNT
Freescale Semiconductor, Inc.
19
0
0
3
18
0
0
2
17
0
0
1
16
0
0
0

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