mcf51jf128 Freescale Semiconductor, Inc, mcf51jf128 Datasheet - Page 614

• Manufacturer Part Number: mcf51jf128
• Description: Mcf51jf128 Reference Manual
• Manufacturer: Freescale Semiconductor, Inc

Memory Map/Register Definition
614
FIFO_SIZE
FIFO_LVL
Reserved
Reserved
STATPF
ST_PF
NSDN
31–24
23–21
20–17
15–12
11–8
Field
ERR
SDN
16
7
6
5
Statistics test pass fail.
Indicates pass or fail status of the various statistics tests on the last seed generated.
0
1
Self Test Pass Fail.
Indicates Pass or Fail status of the TRNG, PRNG, and RESEED self tests,
0
1
This read-only bitfield is reserved and always has the value zero.
Error.
Indicates an error was detected in the RNGB. Read the RNG_ESR register for details.
0
1
FIFO size.
Size of the FIFO, and maximum possible FIFO level. The bits should be interpreted as an integer. This
value is set to five on the default version of RNGB.
FIFO level.
Indicates the number of random words currently in the output FIFO. The bits should be interpreted as an
integer.
This read-only bit is reserved and always has the value zero.
New seed done.
Indicates that a new seed is ready for use during the next seed generation process.
Seed done.
Indicates the RNG has generated the first seed.
0
1
• Bit 31 - Long run test (>34)
• Bit 30 - Length 6+ run test
• Bit 29 - Length 5 run test
• Bit 28 - Length 4 run test
• Bit 27 - Length 3 run test
• Bit 26 - Length 2 run test
• Bit 25 - Length 1 run test
• Bit 24 - Monobit test
• Bit 23 - TRNG self test pass/fail
• Bit 22 - PRNG self test pass/fail
• Bit 21 - RESEED self test pass/fail
Pass.
Fail.
Pass.
Fail.
No error.
Error detected.
Seed generation process not complete.
Completed seed generation since the last reset.
MCF51JF128 Reference Manual, Rev. 2, 03/2011
RNG_SR field descriptions
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Preliminary
Description
Freescale Semiconductor, Inc.